 | 2008 |
|---|
| 6 |       | Kip Killpack,
Suriyaprakash Natarajan,
Arun Krishnamachary,
Pouria Bastani:
Case Study on Speed Failure Causes in a Microprocessor.
IEEE Design & Test of Computers 25(3): 224-230 (2008) |
| 2003 |
|---|
| 5 | | Arun Krishnamachary,
Jacob A. Abraham:
Effects of Multi-cycle Sensitization on Delay Tests.
VLSI Design 2003: 137-142 |
| 2002 |
|---|
| 4 | | Arun Krishnamachary,
Jacob A. Abraham:
Test generation for resistive opens in CMOS.
ACM Great Lakes Symposium on VLSI 2002: 65-70 |
| 3 | | Jacob A. Abraham,
Arun Krishnamachary,
Raghuram S. Tupuri:
A Comprehensive Fault Model for Deep Submicron Digital Circuits.
DELTA 2002: 360-364 |
| 2001 |
|---|
| 2 | | Arun Krishnamachary,
Jacob A. Abraham,
Raghuram S. Tupuri:
Timing Verification and Delay Test Generation for Hierarchical Designs.
VLSI Design 2001: 157-162 |
| 1999 |
|---|
| 1 | | Raghuram S. Tupuri,
Arun Krishnamachary,
Jacob A. Abraham:
Test Generation for Gigahertz Processors Using an Automatic Functional Constraint Extractor.
DAC 1999: 647-652 |
