Norio Kuji

	2001
5		Norio Kuji, Takako Ishihara: EB-Testing-Pad Method and Its Evaluation by Actual Devices. Asian Test Symposium 2001: 179-184
	1997
4		Norio Kuji: Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits. Asian Test Symposium 1997: 174-
	1986
3		Norio Kuji, Teruo Tamama: An Automated F-Beam Tester with CAD Interface, "Finder": A Powerful Tool for Fault Diagnosis of ASICs. ITC 1986: 857-863
2		Norio Kuji, Teruo Tamama, M. Nagatani: FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 5(2): 313-319 (1986)
	1985
1		Norio Kuji, Teruo Tamama: Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit. ITC 1985: 643-651

Coauthor Index

1	Takako Ishihara	[5]
2	M. Nagatani	[2]
3	Teruo Tamama	[1] [2] [3]

Colors in the list of coauthors