Ben Kup

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2002

2 Rodger Schuttert, Frans de Jong, Ben Kup: Improved Test Monitor Circuit in Power Pin DfT. VTS 2002: 345-350

2000

1 Frans de Jong, Ben Kup, Rodger Schuttert: Power pin testing: making the test coverage complete. ITC 2000: 575-584

	2002
2		Rodger Schuttert, Frans de Jong, Ben Kup: Improved Test Monitor Circuit in Power Pin DfT. VTS 2002: 345-350
	2000
1		Frans de Jong, Ben Kup, Rodger Schuttert: Power pin testing: making the test coverage complete. ITC 2000: 575-584

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