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 | 1983 | |
|---|---|---|
| 1 |      | Masato Kawai, H. Shibano, S. Funatsu, S. Kato, T. Kurobe, K. Ookawa, T. Sasaki: A High Level Test Pattern Generation Algorithm. ITC 1983: 346-353 |
| 1 | S. Funatsu | [1] |
| 2 | S. Kato | [1] |
| 3 | Masato Kawai | [1] |
| 4 | K. Ookawa | [1] |
| 5 | T. Sasaki | [1] |
| 6 | H. Shibano | [1] |