 | 2001 |
|---|
| 7 |       | Mary P. Kusko,
Bryan J. Robbins,
Timothy J. Koprowski,
William V. Huott:
99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor.
ITC 2001: 586-592 |
| 1999 |
|---|
| 6 | | Peilin Song,
Franco Motika,
Daniel R. Knebel,
Rick Rizzolo,
Mary P. Kusko,
Julie Lee,
Moyra K. McManus:
Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor.
ITC 1999: 1073-1082 |
| 5 |  | Peilin Song,
Franco Motika,
Daniel R. Knebel,
Richard F. Rizzolo,
Mary P. Kusko:
S/390 G5 CMOS microprocessor diagnostics.
IBM Journal of Research and Development 43(5): 899-914 (1999) |
| 1998 |
|---|
| 4 | | Mary P. Kusko,
Bryan J. Robbins,
Thomas J. Snethen,
Peilin Song,
Thomas G. Foote,
William V. Huott:
Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip.
ITC 1998: 717-726 |
| 3 | | Thomas G. Foote,
Dale E. Hoffman,
William V. Huott,
Timothy J. Koprowski,
Mary P. Kusko,
Bryan J. Robbins:
Testing the 500-MHz IBM S/390 Microprocessor.
IEEE Design & Test of Computers 15(3): 83-89 (1998) |
| 1997 |
|---|
| 2 | | Thomas G. Foote,
Dale E. Hoffman,
William V. Huott,
Timothy J. Koprowski,
Bryan J. Robbins,
Mary P. Kusko:
Testing the 400-MHz IBM Generation-4 CMOS Chip.
ITC 1997: 106-114 |
| 1 | | William V. Huott,
Timothy J. Koprowski,
Bryan J. Robbins,
Mary P. Kusko,
Stephen Pateras,
Dale E. Hoffman,
Timothy G. McNamara,
Thomas J. Snethen:
Advanced microprocessor test strategy and methodology.
IBM Journal of Research and Development 41(4&5): 611-628 (1997) |
