David R. Lakin II

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1999

2 David R. Lakin II, Adit D. Singh: Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study. ITC 1999: 23-30

1998

1 Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh: Binning for IC Quality: Experimental Studies on the SEMATECH Data. DFT 1998: 4-10

	1999
2		David R. Lakin II, Adit D. Singh: Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study. ITC 1999: 23-30
	1998
1		Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh: Binning for IC Quality: Experimental Studies on the SEMATECH Data. DFT 1998: 4-10

Coauthor Index

1 Phil Nigh [1]

2 Adit D. Singh [1] [2]

3 Gaurav Sinha [1]