 | 2007 |
|---|
| 6 |       | Mary Yvonne Lanzerotti,
Giovanni Fiorenza,
Rick A. Rand:
Impact of interconnect length changes on effective materials properties (dielectric constant).
SLIP 2007: 73-80 |
| 2005 |
|---|
| 5 | | Gerald G. Lopez,
Giovanni Fiorenza,
Thomas J. Bucelot,
Phillip Restle,
Mary Yvonne Lanzerotti:
Characterization of the impact of interconnect design on the capacitive load driven by a global clock distribution.
ACM Great Lakes Symposium on VLSI 2005: 38-43 |
| 4 | | Mary Yvonne Lanzerotti,
Giovanni Fiorenza,
Rick A. Rand:
Predicting interconnect requirements in ultra-large-scale integrated control logic circuitry.
SLIP 2005: 43-50 |
| 3 | | Mary Yvonne Lanzerotti,
Giovanni Fiorenza,
Rick A. Rand:
Microminiature packaging and integrated circuitry: The work of E. F. Rent, with an application to on-chip interconnection requirements.
IBM Journal of Research and Development 49(4-5): 777-803 (2005) |
| 2004 |
|---|
| 2 | | Mary Yvonne Lanzerotti,
Giovanni Fiorenza,
Rick A. Rand:
Assessment of on-chip wire-length distribution models.
IEEE Trans. VLSI Syst. 12(10): 1108-1112 (2004) |
| 1 | | Mary Yvonne Lanzerotti,
Giovanni Fiorenza,
Rick A. Rand:
Interpretation of rent's rule for ultralarge-scale integrated circuit designs, with an application to wirelength distribution models.
IEEE Trans. VLSI Syst. 12(12): 1330-1347 (2004) |
