Victor Lau
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2004
1
EE
N. H. Yeung
, Victor Lau,
Y. C. Chan
: Bias-HAST on tape ball grid array (TBGA) test pattern.
Microelectronics Reliability 44
(4): 595-602 (2004)
Coauthor Index
1
Y. C. Chan
[
1
]
2
N. H. Yeung
[
1
]
Copyright ©
Sat Jul 4 15:37:37 2009 by
Michael Ley
(
ley@uni-trier.de
)
