Jung Youp Lee
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2005
1
Jung Youp Lee,
Seok Won Jung
,
Jongin Lim
: Detecting Trapdoors in Smart Cards Using Timing and Power Analysis.
TestCom 2005
: 275-288
Coauthor Index
1
Seok Won Jung
[
1
]
2
Jongin Lim
(Jong In Lim)
[
1
]
Copyright ©
Wed Nov 25 14:46:41 2009 by
Michael Ley
(
ley@uni-trier.de
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