Kyung Tek Lee

	1999
3		Kyung Tek Lee, Jacob A. Abraham: Critical path identification and delay tests of dynamic circuits. ITC 1999: 421-430
	1998
2		Kyung Tek Lee, Clay Nordquist, Jacob A. Abraham: Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits. VTS 1998: 34-41
	1997
1		Rathish Jayabharathi, Kyung Tek Lee, Jacob A. Abraham: A Novel Solution for Chip-Level Functional Timing Verification. VTS 1997: 137-142

Coauthor Index

1	Jacob A. Abraham	[1] [2] [3]
2	Rathish Jayabharathi	[1]
3	Clay Nordquist	[2]