Sanghyun Lee

	2002
2		Yongseok Ahn, Sanghyun Lee, Gwanhyeob Koh, Taeyoung Chung, Kinam Kim: The abnormality in gate oxide failure induced by stress-enhanced diffusion of polycrystalline silicon. Microelectronics Reliability 42(3): 349-354 (2002)
	2001
1		Sanghyun Lee: Challenges in Building Design and the Construction Industry: The Future of Design and Construction in the Internet Age. Human.Society@Internet 2001: 225-236

Coauthor Index

1	Yongseok Ahn	[2]
2	Taeyoung Chung	[2]
3	Kinam Kim	[2]
4	Gwanhyeob Koh	[2]