Yung-Huei Lee

	2005
2		Yung-Huei Lee, Steve Jacobs, Stefan Stadler, Neal Mielke, Ramez Nachman: The impact of PMOST bias-temperature degradation on logic circuit reliability performance. Microelectronics Reliability 45(1): 107-114 (2005)
	2001
1		Yung-Huei Lee, Tom Linton, Ken Wu, Neal Mielke: Effect of trench edge on pMOSFET reliability. Microelectronics Reliability 41(5): 689-696 (2001)

Coauthor Index

1	Steve Jacobs	[2]
2	Tom Linton	[1]
3	Neal Mielke	[1] [2]
4	Ramez Nachman	[2]
5	Stefan Stadler	[2]
6	Ken Wu	[1]