| 1992 | ||
|---|---|---|
| 2 | Yaron Aizenbud, Paul Chang, Moshe Leibowitz, Dave Smith, Bernd Könemann, Vijay S. Iyengar, Barry K. Rosen: AC Test Quality: Beyond Transition Fault Coverage. ITC 1992: 568-577 | |
| 1991 | ||
| 1 | Aharon Aharon, Ayal Bar-David, Barry Dorfman, Emanuel Gofman, Moshe Leibowitz, Victor Schwartzburd: Verification of the IBM RISC System/6000 by a Dynamic Biased Pseudo-Random Test Program Generator. IBM Systems Journal 30(4): 527-538 (1991) | |