M. Leicht

	2002
2		Maria Stangoni, Mauro Ciappa, Marco Buzzo, M. Leicht, Wolfgang Fichtner: Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction. Microelectronics Reliability 42(9-11): 1701-1706 (2002)
	2001
1		M. Leicht, G. Fritzer, B. Basnar, S. Golka, J. Smoliner: A reliable course of Scanning Capacitance Microscopy analysis applied for 2D-Dopant Profilings of Power MOSFET Devices. Microelectronics Reliability 41(9-10): 1535-1537 (2001)

Coauthor Index

1	B. Basnar	[1]
2	Marco Buzzo	[2]
3	Mauro Ciappa	[2]
4	Wolfgang Fichtner	[2]
5	G. Fritzer	[1]
6	S. Golka	[1]
7	J. Smoliner	[1]
8	Maria Stangoni	[2]

Colors in the list of coauthors