Andreas Leininger

	2009
3		Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel: X-tolerant Test Data Compaction with Accelerated Shift Registers. J. Electronic Testing 25(4-5): 247-258 (2009)
	2004
2		Andreas Leininger, Michael Gössel, Peter Muhmenthaler: Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code. DATE 2004: 1302-1309
1		Michael Gössel, Krishnendu Chakrabarty, Vitalij Ocheretnij, Andreas Leininger: A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST. J. Electronic Testing 20(6): 611-622 (2004)

Coauthor Index

1	Michael Braun	[3]
2	Krishnendu Chakrabarty	[1]
3	Michael Gössel	[1] [2] [3]
4	Martin Hilscher	[3]
5	Peter Muhmenthaler	[2]
6	Vitalij Ocheretnij	[1]
7	Michael Richter	[3]