Adam W. Ley

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1999

2 Adam W. Ley: The integration of boundary-scan test methods to a mixed-signal environment. ITC 1999: 159-162

1 Mike Wondolowski, Ben Bennetts, Adam W. Ley: Boundary Scan: The Internet of Test. IEEE Design & Test of Computers 16(3): 34-43 (1999)

	1999
2		Adam W. Ley: The integration of boundary-scan test methods to a mixed-signal environment. ITC 1999: 159-162
1		Mike Wondolowski, Ben Bennetts, Adam W. Ley: Boundary Scan: The Internet of Test. IEEE Design & Test of Computers 16(3): 34-43 (1999)

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