Chien-Mo James Li

James Chien-Mo Li

	2009
17		Bing-Chuan Bai, Augusli Kifli, Chien-Mo James Li, Kun-Cheng Wu: Fault modeling and testing of retention flip-flops in low power designs. ASP-DAC 2009: 684-689
	2008
16		Shianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Michael Hsiao, James Chien-Mo Li, Jiun Lang Huang, Ravi Apte: On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs. DFT 2008: 143-151
15		Yu Huang, Ruifeng Guo, Wu-Tung Cheng, James Chien-Mo Li: Survey of Scan Chain Diagnosis. IEEE Design & Test of Computers 25(3): 240-248 (2008)
14		Wei-Shun Chuang, Shiu-Ting Lin, Wei-Chih Liu, James Chien-Mo Li: Diagnosis of Multiple Scan Chain Timing Faults. IEEE Trans. on CAD of Integrated Circuits and Systems 27(6): 1104-1116 (2008)
13		Yu-Te Liaw, Bing-Chuan Bai, James Chien-Mo Li: A Two-level Simultaneous Test Data and Time Reduction Technique for SOC. J. Inf. Sci. Eng. 24(3): 841-857 (2008)
	2007
12		Chun-Yi Lee, Hung-Mao Lin, Fang-Min Wang, James Chien-Mo Li: Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies. ASP-DAC 2007: 835-840
11		James Chien-Mo Li, Hung-Mao Lin, Fang-Min Wang: Column Parity Row Selection (CPRS) BIST Diagnosis Technique: Modeling and Analysis. IEEE Trans. Computers 56(3): 402-414 (2007)
	2005
10		Min-Hao Chiu, Chien-Mo James Li: Jump Scan: A DFT Technique for Low Power Testing. VTS 2005: 277-282
9		James Chien-Mo Li: Diagnosis of Multiple Hold-Time and Setup-Time Faults in Scan Chains. IEEE Trans. Computers 54(11): 1467-1472 (2005)
8		Chien-Mo James Li, Edward J. McCluskey: Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs. IEEE Trans. on CAD of Integrated Circuits and Systems 24(11): 1748-1759 (2005)
7		James Chien-Mo Li: Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns. IEICE Transactions 88-A(4): 1024-1030 (2005)
	2004
6		Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra: ELF-Murphy Data on Defects and Test Sets. VTS 2004: 16-22
	2002
5		Chien-Mo James Li, Edward J. McCluskey: Diagnosis of Sequence-Dependent Chips. VTS 2002: 187-192
	2001
4		Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey: Testing for resistive opens and stuck opens. ITC 2001: 1049-1058
3		Chien-Mo James Li, Edward J. McCluskey: Diagnosis of Tunneling Opens. VTS 2001: 22-27
	2000
2		Chien-Mo James Li, Edward J. McCluskey: Testing for tunneling opens. ITC 2000: 85-94
	1998
1		Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey: Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. ITC 1998: 184-193

Coauthor Index

1	Ahmad A. Al-Yamani	[6]
2	Ravi Apte	[16]
3	Bing-Chuan Bai	[13] [17]
4	Jonathan T.-Y. Chang	[1]
5	Wu-Tung Cheng	[15]
6	Min-Hao Chiu	[10]
7	Wei-Shun Chuang	[14]
8	François-Fabien Ferhani	[6]
9	Ruifeng Guo	[15]
10	Michael Hsiao	[16]
11	Jiun Lang Huang	[16]
12	Yu Huang	[15]
13	Zhigang Jiang	[16]
14	Augusli Kifli	[17]
15	Chun-Yi Lee	[12]
16	Edward Li	[6]
17	Yu-Te Liaw	[13]
18	Hung-Mao Lin	[11] [12]
19	Shiu-Ting Lin	[14]
20	Wei-Chih Liu	[14]
21	Edward J. McCluskey	[1] [2] [3] [4] [5] [6] [8]
22	Subhasish Mitra	[6]
23	Mike Purtell	[1] [4]
24	Boryau Sheu	[16]
25	Jiayong Song	[16]
26	Chao-Wen Tseng	[1] [4] [6]
27	Erik H. Volkerink	[6]
28	Fang-Min Wang	[11] [12]
29	Laung-Terng Wang	[16]
30	Xiaoqing Wen	[16]
31	Kun-Cheng Wu	[17]
32	Shianling Wu	[16]

Colors in the list of coauthors