Jin-Fu Li Coauthor index DBLP Vis pubzone.org

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DBLP keys2009
37Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBing-Wei Huang, Jin-Fu Li: Efficient diagnosis algorithms for drowsy SRAMs. ISQED 2009: 276-279
36Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHsiang-Ning Liu, Yu-Jen Huang, Jin-Fu Li: Memory Built-in Self Test in Multicore Chips with Mesh-Based Networks. IEEE Micro 29(5): 46-55 (2009)
2008
35Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHong-Ming Shieh, Jin-Fu Li: A Multi-Code Compression Scheme for Test Time Reduction of System-on-Chip Designs. IEICE Transactions 91-D(10): 2428-2434 (2008)
34Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDa-Ming Chang, Jin-Fu Li, Yu-Jen Huang: A Built-In Redundancy-Analysis Scheme for Random Access Memories with Two-Level Redundancy. J. Electronic Testing 24(1-3): 181-192 (2008)
2007
33Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLTsu-Wei Tseng, Chun-Hsien Wu, Yu-Jen Huang, Jin-Fu Li, Alex Pao, Kevin Chiu, Eliot Chen: A Built-In Self-Repair Scheme for Multiport RAMs. VTS 2007: 355-360
32Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey: An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories CoRR abs/0710.4747: (2007)
31Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu: Raisin: Redundancy Analysis Algorithm Simulation. IEEE Design & Test of Computers 24(4): 386-396 (2007)
30Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChao-Da Huang, Jin-Fu Li, Tsu-Wei Tseng: ProTaR: An Infrastructure IP for Repairing RAMs in System-on-Chips. IEEE Trans. VLSI Syst. 15(10): 1135-1143 (2007)
29Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li: Transparent-Test Methodologies for Random Access Memories Without/With ECC. IEEE Trans. on CAD of Integrated Circuits and Systems 26(10): 1888-1893 (2007)
28Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li: Testing Ternary Content Addressable Memories With Comparison Faults Using March-Like Tests. IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 919-931 (2007)
27Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Chao-Da Huang: An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults. IEICE Transactions 90-A(12): 2703-2711 (2007)
2006
26Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLTsu-Wei Tseng, Jin-Fu Li, Da-Ming Chang: A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap. DATE 2006: 53-58
25Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYu-Jen Huang, Da-Ming Chang, Jin-Fu Li: A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy. DFT 2006: 362-370
24Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYu-Jen Huang, Jin-Fu Li: Testing Active Neighborhood Pattern-Sensitive Faults of Ternary Content Addressable Memories. European Test Symposium 2006: 55-62
2005
23Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li: Testing comparison faults of ternary CAMs based on comparison faults of binary CAMs. ASP-DAC 2005: 65-70
22Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey: An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories. DATE 2005: 574-579
21Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Jiunn-Der Yu, Yu-Jen Huang: A design methodology for hybrid carry-lookahead/carry-select adders with reconfigurability. ISCAS (1) 2005: 77-80
20Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Chou-Kun Lin: Modeling and Testing Comparison Faults for Ternary Content Addressable Memories. VTS 2005: 60-65
19Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu: A built-in self-repair design for RAMs with 2-D redundancy. IEEE Trans. VLSI Syst. 13(6): 742-745 (2005)
2004
18Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Chao-Da Huang: An Efficient Diagnosis Scheme for Random Access Memories. Asian Test Symposium 2004: 277-282
17Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Chih-Chiang Hsu: Efficient Test Methodologies for Conditional Sum Adders. Asian Test Symposium 2004: 319-324
2003
16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu, Peir-Yuan Tsai, Archer Hsu, Eugene Chow: A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy. ITC 2003: 393-402
15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu Li: A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories. MTDT 2003: 53-
14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Tsun Huang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu: Built-in redundancy analysis for memory yield improvement. IEEE Transactions on Reliability 52(4): 386-399 (2003)
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu: Testing and Diagnosis Methodologies for Embedded Content Addressable Memories. J. Electronic Testing 19(2): 207-215 (2003)
2002
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Hsin-Jung Huang, Jeng-Bin Chen, Chih-Pin Su, Cheng-Wen Wu, Chuang Cheng, Shao-I Chen, Chi-Yi Hwang, Hsiao-Ping Lin: A Hierarchical Test Scheme for System-On-Chip Designs. DATE 2002: 486-490
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu: A Simulator for E aluating Redundancy Analysis Algorithms of Repairable Embedded Memories. IOLTW 2002: 262-
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu: A Simulator for Evaluating Redundancy Analysis Algorithms of Repairable Embedded Memories. MTDT 2002: 68-
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu: Testing and Diagnosing Embedded Content Addressable Memories. VTS 2002: 389-394
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Hsin-Jung Huang, Jeng-Bin Chen, Chih-Pin Su, Cheng-Wen Wu, Chuang Cheng, Shao-I Chen, Chi-Yi Hwang, Hsiao-Ping Lin: A Hierarchical Test Methodology for Systems on Chip. IEEE Micro 22(5): 69-81 (2002)
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Cheng-Wen Wu: Efficient FFT network testing and diagnosis schemes. IEEE Trans. VLSI Syst. 10(3): 267-278 (2002)
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu: Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test. J. Electronic Testing 18(4-5): 515-527 (2002)
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Wea Wang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu, Tony Teng, Kevin Chiu, Hsiao-Ping Lin: A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM. J. Electronic Testing 18(6): 637-647 (2002)
2001
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Cheng-Wen Wu: Memory fault diagnosis by syndrome compression. DATE 2001: 97-101
3no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Kuo-Liang Cheng, Chih-Tsun Huang, Cheng-Wen Wu: March-based RAM diagnosis algorithms for stuck-at and coupling faults. ITC 2001: 758-767
2000
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Wea Wang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu, Tony Teng, Kevin Chiu, Hsiao-Ping Lin: A built-in self-test and self-diagnosis scheme for embedded SRAM. Asian Test Symposium 2000: 45-50
1999
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJin-Fu Li, Cheng-Wen Wu: Testable and Fault Tolerant Design for FFT Networks. DFT 1999: 201-209

Coauthor Index

1Da-Ming Chang [25] [26] [34]
2Eliot Chen [33]
3Jeng-Bin Chen [8] [12]
4Shao-I Chen [8] [12]
5Chuang Cheng [8] [12]
6Kuo-Liang Cheng [3]
7Kevin Chiu [2] [5] [33]
8Eugene Chow [16]
9Li-Ming Denq [15]
10Archer Hsu [16]
11Chih-Chiang Hsu [17]
12Bing-Wei Huang [37]
13Chao-Da Huang [18] [27] [30]
14Chih-Tsun Huang [3] [14]
15Hsin-Jung Huang [8] [12]
16Rei-Fu Huang [10] [11] [15] [16] [19] [31]
17Yu-Jen Huang [21] [24] [25] [33] [34] [36]
18Chi-Yi Hwang [8] [12]
19Chou-Kun Lin [20]
20Hsiao-Ping Lin [2] [5] [8] [12]
21Hsiang-Ning Liu [36]
22Alex Pao [33]
23Hong-Ming Shieh [35]
24Chih-Pin Su [8] [12]
25Tony Teng [2] [5]
26Peir-Yuan Tsai [16]
27Tsu-Wei Tseng [22] [26] [30] [32] [33]
28Ruey-Shing Tzeng [6] [9] [13]
29Chih-Wea Wang [2] [5]
30Chin-Long Wey [22] [32]
31Cheng-Wen Wu [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [19] [31]
32Chi-Feng Wu [2] [5] [14]
33Chun-Hsien Wu [33]
34Jen-Chieh Yeh [10] [11] [16] [19] [31]
35Jiunn-Der Yu [21]

Colors in the list of coauthors

Copyright © Fri Dec 18 14:20:30 2009 by Michael Ley (ley@uni-trier.de)