Junjun Li Coauthor index pubzone.org

List of publications from the DBLP Bibliography Server - FAQ
Ask others: ACM DL/Guide - CiteSeerX - CSB - MetaPress - Google - Bing - Yahoo

DBLP keys2011
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJunjun Li, Zhizhang Wang, Zhihuan Zhang, Jiang Dan: Research and Application of gas reservoir modeling. FSKD 2011: 2545-2548
2010
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAli Khaki-Firooz, Kangguo Cheng, Basanth Jagannathan, Pranita Kulkarni, Jeffrey W. Sleight, Davood Shahrjerdi, Josephine B. Chang, Sungjae Lee, Junjun Li, Huiming Bu, Robert Gauthier, Bruce Doris, Ghavam Shahidi: Fully depleted extremely thin SOI for mainstream 20nm low-power technology and beyond. ISSCC 2010: 152-153
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLT. Cilento, M. Schenkel, C. Yun, R. Mishra, Junjun Li, Kiran V. Chatty, Robert Gauthier: Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology. Microelectronics Reliability 50(9-11): 1367-1372 (2010)
2009
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid Alvarez, Kiran V. Chatty, Christian Russ, Michel J. Abou-Khalil, Junjun Li, Robert Gauthier, Kai Esmark, Ralph Halbach, Christopher Seguin: Design optimization of gate-silicided ESD NMOSFETs in a 45 nm bulk CMOS technology. Microelectronics Reliability 49(12): 1417-1423 (2009)
2007
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJunjun Li, Yi Sun, Myung J. Lee: On Performance of Cooperative Large CDMA Random Access Networks. GLOBECOM 2007: 3948-3952
2006
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJunjun Li, S. Joshi, R. Barnes, E. Rosenbaum: Compact modeling of on-chip ESD protection devices using Verilog-A. IEEE Trans. on CAD of Integrated Circuits and Systems 25(6): 1047-1063 (2006)
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid Alvarez, Michel J. Abou-Khalil, Christian Russ, Kiran V. Chatty, Robert Gauthier, D. Kontos, Junjun Li, Christopher Seguin, Ralph Halbach: Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. Microelectronics Reliability 46(9-11): 1597-1602 (2006)

Coauthor Index

1Michel J. Abou-Khalil [1] [4]
2David Alvarez [1] [4]
3R. Barnes [2]
4Huiming Bu [6]
5Josephine B. Chang [6]
6Kiran V. Chatty [1] [4] [5]
7Kangguo Cheng [6]
8T. Cilento [5]
9Jiang Dan [7]
10Bruce Doris [6]
11Kai Esmark [4]
12Robert Gauthier [1] [4] [5] [6]
13Ralph Halbach [1] [4]
14Basanth Jagannathan [6]
15S. Joshi [2]
16Ali Khaki-Firooz [6]
17D. Kontos [1]
18Pranita Kulkarni [6]
19Myung J. Lee [3]
20Sungjae Lee [6]
21R. Mishra [5]
22E. Rosenbaum [2]
23Christian Russ [1] [4]
24M. Schenkel [5]
25Christopher Seguin [1] [4]
26Ghavam Shahidi [6]
27Davood Shahrjerdi [6]
28Jeffrey W. Sleight [6]
29Yi Sun [3]
30Zhizhang Wang [7]
31C. Yun [5]
32Zhihuan Zhang [7]

Colors in the list of coauthors

Last update Fri May 25 01:42:58 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page