Tien-Yeh Li

	2008
1		Yiming Li, Chih-Hong Hwang, Ta-Ching Yeh, Tien-Yeh Li: Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits. ICCAD 2008: 278-285

Coauthor Index

1	Chih-Hong Hwang	[1]
2	Yiming Li	[1]
3	Ta-Ching Yeh	[1]