Xiaowei Li

	2009
78		Guihai Yan, Yinhe Han, Xiaowei Li: A unified online Fault Detection scheme via checking of Stability Violation. DATE 2009: 496-501
	2008
77		Fei Wang, Yu Hu, Huawei Li, Xiaowei Li: A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults. ASP-DAC 2008: 571-576
76		Jia Li, Qiang Xu, Yu Hu, Xiaowei Li: On reducing both shift and capture power for scan-based testing. ASP-DAC 2008: 653-658
75		Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li: Robust test generation for power supply noise induced path delay faults. ASP-DAC 2008: 659-662
74		Changchang Wu, Brian Clipp, Xiaowei Li, Jan-Michael Frahm, Marc Pollefeys: 3D model matching with Viewpoint-Invariant Patches (VIP). CVPR 2008
73		Jia Li, Qiang Xu, Yu Hu, Xiaowei Li: iFill: An Impact-Oriented X-Filling Method for Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing. DATE 2008: 1184-1189
72		Lei Zhang, Yinhe Han, Qiang Xu, Xiaowei Li: Defect Tolerance in Homogeneous Manycore Processors Using Core-Level Redundancy with Unified Topology. DATE 2008: 891-896
71		Fei Wang, Yu Hu, Xiaowei Li: Adaptive Diagnostic Pattern Generation for Scan Chains. DELTA 2008: 129-132
70		Jia Li, Qiang Xu, Yu Hu, Xiaowei Li: Channel Width Utilization Improvement in Testing NoC-Based Systems for Test Time Reduction. DELTA 2008: 26-31
69		Da Wang, Rui Li, Yu Hu, Huawei Li, Xiaowei Li: A Case Study on At-Speed Testing for a Gigahertz Microprocessor. DELTA 2008: 326-331
68		Minjin Zhang, Huawei Li, Xiaowei Li: Static Crosstalk Noise Analysis with Transition Map. DELTA 2008: 462-465
67		Hui Liu, Huawei Li, Yu Hu, Xiaowei Li: A Scan-Based Delay Test Method for Reduction of Overtesting. DELTA 2008: 521-526
66		Xiaowei Li, Changchang Wu, Christopher Zach, Svetlana Lazebnik, Jan-Michael Frahm: Modeling and Recognition of Landmark Image Collections Using Iconic Scene Graphs. ECCV (1) 2008: 427-440
65		Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, Qiang Xu: On capture power-aware test data compression for scan-based testing. ICCAD 2008: 67-72
64		Ying Zhang, Huawei Li, Xiaowei Li, Yu Hu: Codeword Selection for Crosstalk Avoidance and Error Correction on Interconnects. VTS 2008: 377-382
63		Minjin Zhang, Huawei Li, Xiaowei Li: Multiple Coupling Effects Oriented Path Delay Test Generation. VTS 2008: 383-388
62		Guihai Yan, Yinhe Han, Xiaowei Li, Hui Liu: BAT: Performance-Driven Crosstalk Mitigation Based on Bus-Grouping Asynchronous Transmission. IEICE Transactions 91-C(10): 1690-1697 (2008)
61		Da Wang, Yu Hu, Huawei Li, Xiaowei Li: Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor. J. Comput. Sci. Technol. 23(6): 1037-1046 (2008)
	2007
60		Lei Zhang, Huawei Li, Xiaowei Li: A Routing Algorithm for Random Error Tolerance in Network-on-Chip. HCI (4) 2007: 1210-1219
59		Yinhe Han, Yu Hu, Xiaowei Li, Huawei Li, Anshuman Chandra: Embedded Test Decompressor to Reduce the Required Channels and Vector Memory of Tester for Complex Processor Circuit. IEEE Trans. VLSI Syst. 15(5): 531-540 (2007)
58		Guangyan Huang, Xiaowei Li, Jing He, Xin Li: Data Mining via Minimal Spanning Tree Clustering for Prolonging Lifetime of Wireless Sensor Networks. International Journal of Information Technology and Decision Making 6(2): 235-251 (2007)
57		Wei Wang, Yu Hu, Yinhe Han, Xiaowei Li, You-Sheng Zhang: Leakage Current Optimization Techniques During Test Based on Don't Care Bits Assignment. J. Comput. Sci. Technol. 22(5): 673-680 (2007)
	2006
56		Hongyang Chen, Ping Deng, Yongjun Xu, Xiaowei Li: A Novel Localization Scheme Based on RSS Data for Wireless Sensor Networks. APWeb Workshops 2006: 315-320
55		Lei Xie, Yongjun Xu, Xiaowei Li, Yuefei Zhu: A Lightweight Scheme for Trust Relationship Establishment in Ubiquitous Sensor Networks. CIT 2006: 229
54		Dan Hou, Xia Shen, Xiaowei Li, Yue Liu, Yongtian Wang: Digital Restoration of Historical Heritage by Reconstruction from Uncalibrated Images. Edutainment 2006: 1377-1382
53		Tong Liu, Huawei Li, Xiaowei Li, Yinhe Han: Fast Packet Classification using Group Bit Vector. GLOBECOM 2006
52		Jie Don, Yu Hu, Yinhe Han, Xiaowei Li: An on-chip combinational decompressor for reducing test data volume. ISCAS 2006
51		Guangyan Huang, Xiaowei Li, Jing He: Clustering Versus Evenly Distributing Energy Dissipation in Wireless Sensor Routing for Prolonging Network Lifetime. International Conference on Computational Science (2) 2006: 1069-1072
50		Huawei Li, Pei-Fu Shen, Xiaowei Li: Robust Test Generation for Precise Crosstalk-induced Path Delay Faults. VTS 2006: 300-305
49		Yu Hu, Yinhe Han, Xiaowei Li, Huawei Li, Xiaoqing Wen: Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time. IEICE Transactions 89-D(10): 2616-2625 (2006)
48		Tao Lv, Jianping Fan, Xiaowei Li, Ling-Yi Liu: Observability Statement Coverage Based on Dynamic Factored Use-Definition Chains for Functional Verification. J. Electronic Testing 22(3): 273-285 (2006)
47		Yinhe Han, Huawei Li, Xiaowei Li, Anshuman Chandra: Response compaction for system-on-a-chip based on advanced convolutional codes. Science in China Series F: Information Sciences 49(2): 262-272 (2006)
	2005
46		Yongjun Xu, Jinghua Chen, Zuying Luo, Xiaowei Li: Vector extraction for average total power estimation. ASP-DAC 2005: 1086-1089
45		Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li: Theoretic analysis and enhanced X-tolerance of test response compact based on convolutional code. ASP-DAC 2005: 53-58
44		Shuguang Gong, Huawei Li, Yufeng Xu, Tong Liu, Xiaowei Li: Design of an efficient memory subsystem for network processor. ASP-DAC 2005: 897-900
43		Pei-Fu Shen, Huawei Li, Yongjun Xu, Xiaowei Li: Non-robust Test Generation for Crosstalk-Induced Delay Faults. Asian Test Symposium 2005: 120-125
42		Yinhe Han, Xiaowei Li, Shivakumar Swaminathan, Yu Hu, Anshuman Chandra: Scan Data Volume Reduction Using Periodically Alterable MUXs Decompressor. Asian Test Symposium 2005: 372-377
41		Guangmei Zhang, Chen Rui, Xiaowei Li, Han Congying: The Automatic Generation of Basis Set of Path for Path Testing. Asian Test Symposium 2005: 46-51
40		Guangyan Huang, Guangmei Zhang, Xiaowei Li, Yunzhan Gong: A State Machine for Detecting C/C++ Memory Faults. Asian Test Symposium 2005: 82-87
39		Xiaowei Li, Yue Liu, Yongtian Wang, Dayuan Yan, Dongdong Weng, Tao Yang: An Improved Colored-Marker Based Registration Method for AR Applications. ICCSA (3) 2005: 266-273
38		Yanzhuo Tan, Yinhe Han, Xiaowei Li, Feiyin Lu, Yuchuan Chen: Validation analysis and test flow optimization of VLSI chip. ISCAS (6) 2005: 5666-5669
37		Ji Li, Yinhe Han, Xiaowei Li: Deterministic and low power BIST based on scan slice overlapping. ISCAS (6) 2005: 5670-5673
36		Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li: Using MUXs Network to Hide Bunches of Scan Chains. ISQED 2005: 238-243
35		Yu Hu, Xiaowei Li, Huawei Li, Xiaoqing Wen: Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power Dissipation and Test Application Time. PRDC 2005: 175-182
34		Yinhe Han, Yu Hu, Xiaowei Li, Huawei Li, Anshuman Chandra, Xiaoqing Wen: Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores. IEICE Transactions 88-D(9): 2126-2134 (2005)
33		Xiaowei Li, Guanghui Li, Ming Shao: Formal Verification Techniques Based on Boolean Satisfiability Problem. J. Comput. Sci. Technol. 20(1): 38-47 (2005)
32		Xiaowei Li: Perface. J. Comput. Sci. Technol. 20(2): 145-145 (2005)
31		Yinhe Han, Xiaowei Li, Huawei Li, Anshuman Chandra: Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Tester Channels Reduction. J. Comput. Sci. Technol. 20(2): 201-209 (2005)
30		Huawei Li, Xiaowei Li: Selection of Crosstalk-Induced Faults in Enhanced Delay Test. J. Electronic Testing 21(2): 181-195 (2005)
	2004
29		Yu Hu, Yinhe Han, Huawei Li, Tao Lv, Xiaowei Li: Pair Balance-Based Test Scheduling for SOCs. Asian Test Symposium 2004: 236-241
28		Guanghui Li, Xiaowei Li: Circuit-Width Based Heuristic for Boolean Reasoning. Asian Test Symposium 2004: 336-341
27		Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman Chandra: Rapid and Energy-Efficient Testing for Embedded Cores. Asian Test Symposium 2004: 8-13
26		Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman Chandra: Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes. DFT 2004: 298-305
25		Yinhe Han, Xiaowei Li: Simultaneous Reduction of Test Data Volume and Testing Power for Scan-Based Test. ESA/VLSI 2004: 374-381
24		Yongjun Xu, Zuying Luo, Xiaowei Li: A maximum total leakage current estimation method. ISCAS (2) 2004: 757-760
23		Xiaowei Li: Conference Reports. IEEE Design & Test of Computers 21(1): 68- (2004)
22		Yongjun Xu, Zuying Luo, Xiaowei Li, Li-Jian Li, Xianlong Hong: Leakage Current Estimation of CMOS Circuit with Stack Effect. J. Comput. Sci. Technol. 19(5): 708-717 (2004)
	2003
21		Yunzhan Gong, Wanli Xu, Xiaowei Li: An Expression's Single Fault Model and the Testing Methods. Asian Test Symposium 2003: 110-115
20		Tao Lv, Jianping Fan, Xiaowei Li: An Efficient Observability Evaluation Algorithm Based on Factored Use-Def Chains. Asian Test Symposium 2003: 161-167
19		Huawei Li, Yue Zhang, Xiaowei Li: Delay Test Pattern Generation Considering Crosstalk-Induced Effects. Asian Test Symposium 2003: 178-183
18		Yongjun Xu, Zuying Luo, Zhiguo Chen, Xiaowei Li: Average Leakage Current Macromodeling for Dual-Threshold Voltage Circuits. Asian Test Symposium 2003: 196-201
17		Yinhe Han, Yongjun Xu, Huawei Li, Xiaowei Li, Anshuman Chandra: Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Teste. Asian Test Symposium 2003: 440-445
16		Guanghui Li, Ming Shao, Xiaowei Li: Design Error Diagnosis Based on Verification Techniques. Asian Test Symposium 2003: 474-477
15		Ming Shao, Guanghui Li, Xiaowei Li: SAT-Based Algorithm of Verification for Port Order Fault. Asian Test Symposium 2003: 478-481
14		Zhigang Yin, Yinghua Min, Xiaowei Li, Huawei Li: A Novel RT-Level Behavioral Description Based ATPG Method. J. Comput. Sci. Technol. 18(3): 308-317 (2003)
	2002
13		Zuying Luo, Xiaowei Li, Huawei Li, Shiyuan Yang, Yinghua Min: Test Power Optimization Techniques for CMOS Circuits. Asian Test Symposium 2002: 332-337
	2001
12		Zhigang Yin, Yinghua Min, Xiaowei Li: An Approach to RTL Fault Extraction and Test Generation. Asian Test Symposium 2001: 219-224
11		Xiaowei Li, Huawei Li, Yinghua Min: Reducing Power Dissipation during At-Speed Test Application. DFT 2001: 116-
10		Xiaowei Li, Paul Y. S. Cheung: A Loop-Based Apparatus for At-Speed Self-Testing. J. Comput. Sci. Technol. 16(3): 278-285 (2001)
	2000
9		Xiaowei Li, Toshimitsu Masuzawa, Hideo Fujiwara: Strong self-testability for data paths high-level synthesis. Asian Test Symposium 2000: 229-234
8		Xiaowei Li, Paul Y. S. Cheung: High Level Synthesis for Loop-Based BIST. J. Comput. Sci. Technol. 15(4): 338-345 (2000)
7		Xiaowei Li, Paul Y. S. Cheung: Exploiting Deterministic TPG for Path Delay Testing. J. Comput. Sci. Technol. 15(5): 472-479 (2000)
6		Xiaowei Li, Paul Y. S. Cheung, Hideo Fujiwara: LFSR-Based Deterministic TPG for Two-Pattern Testing. J. Electronic Testing 16(5): 419-426 (2000)
	1999
5		Xiaowei Li, Paul Y. S. Cheung: Data Path Synthesis for BIST with Low Area Overhead. ASP-DAC 1999: 275-278
4		Xiaowei Li, Paul Y. S. Cheung: Exploiting Test Resource Optimization in Data Path Synthesis for BIST. Great Lakes Symposium on VLSI 1999: 342-343
3		Xiaowei Li, Paul Y. S. Cheung: An approach to behavioral synthesis for loop-based BIST. ISCAS (6) 1999: 374-377
	1998
2		Xiaowei Li, Paul Y. S. Cheung: Exploiting BIST Approach for Two-Pattern Testing. Asian Test Symposium 1998: 424-429
1		Xiaowei Li, Paul Y. S. Cheung: High-Level BIST Synthesis for Delay Testing. DFT 1998: 318-

Coauthor Index

1	Anshuman Chandra	[17] [26] [27] [31] [34] [42] [47] [59]
2	Hongyang Chen	[56]
3	Jinghua Chen	[46]
4	Yuchuan Chen	[38]
5	Zhiguo Chen	[18]
6	Paul Y. S. Cheung	[1] [2] [3] [4] [5] [6] [7] [8] [10]
7	Brian Clipp	[74]
8	Han Congying	[41]
9	Ping Deng	[56]
10	Jie Don	[52]
11	Jianping Fan	[20] [48]
12	Jan-Michael Frahm	[66] [74]
13	Xiang Fu	[75]
14	Hideo Fujiwara	[6] [9]
15	Shuguang Gong	[44]
16	Yunzhan Gong	[21] [40]
17	Yinhe Han	[17] [25] [26] [27] [29] [31] [34] [36] [37] [38] [42] [45] [47] [49] [52] [53] [57] [59] [62] [72] [78]
18	Jing He	[51] [58]
19	Xianlong Hong	[22]
20	Dan Hou	[54]
21	Yu Hu	[26] [27] [29] [34] [35] [36] [42] [45] [49] [52] [57] [59] [61] [64] [65] [67] [69] [70] [71] [73] [75] [76] [77]
22	Guangyan Huang	[40] [51] [58]
23	Svetlana Lazebnik	[66]
24	Guanghui Li	[15] [16] [28] [33]
25	Huawei Li	[11] [13] [14] [17] [19] [26] [27] [29] [30] [31] [34] [35] [36] [43] [44] [45] [47] [49] [50] [53] [59] [60] [61] [63] [64] [67] [68] [69] [75] [77]
26	Ji Li	[37]
27	Jia Li	[65] [70] [73] [76]
28	Li-Jian Li	[22]
29	Rui Li	[69]
30	Xin Li	[58]
31	Hui Liu	[62] [67]
32	Ling-Yi Liu	[48]
33	Tong Liu	[44] [53]
34	Xiao Liu	[65]
35	Yue Liu	[39] [54]
36	Feiyin Lu	[38]
37	Zuying Luo	[13] [18] [22] [24] [46]
38	Tao Lv	[20] [29] [48]
39	Toshimitsu Masuzawa	[9]
40	Yinghua Min	[11] [12] [13] [14]
41	Marc Pollefeys	[74]
42	Chen Rui	[41]
43	Ming Shao	[15] [16] [33]
44	Pei-Fu Shen	[43] [50]
45	Xia Shen	[54]
46	Shivakumar Swaminathan	[42]
47	Yanzhuo Tan	[38]
48	Da Wang	[61] [69]
49	Fei Wang	[71] [77]
50	Wei Wang	[57]
51	Yongtian Wang	[39] [54]
52	Xiaoqing Wen	[34] [35] [49]
53	Dongdong Weng	[39]
54	Changchang Wu	[66] [74]
55	Lei Xie	[55]
56	Qiang Xu	[65] [70] [72] [73] [76]
57	Wanli Xu	[21]
58	Yongjun Xu	[17] [18] [22] [24] [43] [46] [55] [56]
59	Yufeng Xu	[44]
60	Dayuan Yan	[39]
61	Guihai Yan	[62] [78]
62	Shiyuan Yang	[13]
63	Tao Yang	[39]
64	Zhigang Yin	[12] [14]
65	Christopher Zach	[66]
66	Guangmei Zhang	[40] [41]
67	Lei Zhang	[60] [72]
68	Minjin Zhang	[63] [68]
69	Ying Zhang	[64]
70	You-Sheng Zhang	[57]
71	Yubin Zhang	[65]
72	Yue Zhang	[19]
73	Yuefei Zhu	[55]

Colors in the list of coauthors