Y.-L. Li

	2005
4		Nicholas J. Belkin, Michael Cole, Jacek Gwizdka, Y.-L. Li, J.-J. Liu, Gheorghe Muresan, C. A. Smith, A. Taylor, Xiao-Jun Yuan, Dmitri Roussinov: Rutgers Information Interaction Lab at TREC 2005: Trying HARD. TREC 2005
3		Y.-L. Li, Zs. Tökei, Ph. Roussel, Guido Groeseneken, Karen Maex: Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectronics Reliability 45(9-11): 1299-1304 (2005)
2		Zs. Tökei, Y.-L. Li, G. P. Beyer: Reliability challenges for copper low-k dielectrics and copper diffusion barriers. Microelectronics Reliability 45(9-11): 1436-1442 (2005)
	2004
1		Nicholas J. Belkin, I. Chaleva, Michael Cole, Y.-L. Li, Lu Liu, Ying-Hsang Liu, Gheorghe Muresan, Catherine L. Smith, Ying Sun, Xiao-Jun Yuan, Xiao-Min Zhang: Rutgers' HARD Track Experiences at TREC 2004. TREC 2004

Coauthor Index

1	Nicholas J. Belkin	[1] [4]
2	G. P. Beyer	[2]
3	I. Chaleva	[1]
4	Michael Cole	[1] [4]
5	Guido Groeseneken	[3]
6	Jacek Gwizdka	[4]
7	J.-J. Liu	[4]
8	Lu Liu	[1]
9	Ying-Hsang Liu	[1]
10	Karen Maex	[3]
11	Gheorghe Muresan	[1] [4]
12	Ph. Roussel	[3]
13	Dmitri Roussinov	[4]
14	C. A. Smith	[4]
15	Catherine L. Smith	[1]
16	Ying Sun	[1]
17	A. Taylor	[4]
18	Zs. Tökei	[2] [3]
19	Xiao-Jun Yuan	[1] [4]
20	Xiao-Min Zhang	[1]

Colors in the list of coauthors