| 2009 | ||
|---|---|---|
| 2 | Yanjing Li, Young Moon Kim, Evelyn Mintarno, Donald S. Gardner, Subhasish Mitra: Overcoming Early-Life Failure and Aging for Robust Systems. IEEE Design & Test of Computers 26(6): 28-39 (2009) | |
| 2008 | ||
| 1 | Yanjing Li, Samy Makar, Subhasish Mitra: CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns. DATE 2008: 885-890 | |
| 1 | Donald S. Gardner | [2] |
| 2 | Young Moon Kim | [2] |
| 3 | Samy Makar | [1] |
| 4 | Evelyn Mintarno | [2] |
| 5 | Subhasish Mitra | [1] [2] |