| 2010 | ||
|---|---|---|
| 2 | Bin Zhou, Yizheng Ye, Zhao-lin Li, Jian-wei Zhang, Xin-chun Wu, Rui Ke: A test set embedding approach based on twisted-ring counter with few seeds. Integration 43(1): 81-100 (2010) | |
| 2009 | ||
| 1 | Bin Zhou, Yizheng Ye, Zhao-lin Li, Xin-chun Wu, Rui Ke: A new low power test pattern generator using a variable-length ring counter. ISQED 2009: 248-252 | |
| 1 | Rui Ke | [1] [2] |
| 2 | Xin-chun Wu | [1] [2] |
| 3 | Yizheng Ye | [1] [2] |
| 4 | Jian-wei Zhang | [2] |
| 5 | Bin Zhou | [1] [2] |