Huaguo Liang

	2009
14		Maoxiang Yi, Huaguo Liang, Kaihua Zhan, Cuiyun Jiang: Optimal LFSR-Coding Test Data Compression Based on Test Cube Dividing. CSE (2) 2009: 698-702
13		Huaguo Liang, Wenfa Zhan, Qiang Luo, Cuiyun Jiang: A Test Vector Compression/Decompression Scheme Based on Logic Operation between Adjacent Bits (LOBAB) Coding. PRDC 2009: 11-16
12		Jie Wang, Huawei Li, Yinghua Min, Xiaowei Li, Huaguo Liang: Impact of Hazards on Pattern Selection for Small Delay Defects. PRDC 2009: 49-54
	2008
11		Tian Chen, Huaguo Liang, Minsheng Zhang, Wei Wang: A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter. ICYCS 2008: 2272-2277
10		Zhengfeng Huang, Huaguo Liang: A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies. IOLTS 2008: 175-176
	2007
9		Wenfa Zhan, Huaguo Liang, Feng Shi, Zhengfeng Huang: A Novel Collaborative Scheme of Test Data Compression Based on Fixed-Plus-variable-Length Coding. CSCWD 2007: 1044-1049
8		Wenfa Zhan, Huaguo Liang, Feng Shi, Zhengfeng Huang: Test data compression scheme based on variable-to-fixed-plus-variable-length coding. Journal of Systems Architecture 53(11): 877-887 (2007)
	2005
7		Huaguo Liang, Maoxiang Yi, Xiangsheng Fang, Cuiyun Jiang: A BIST Scheme Based on Selecting State Generation of Folding Counters. Asian Test Symposium 2005: 144-149
	2003
6		Huaguo Liang, Cuiyun Jiang: Sharing BIST with Multiple Cores for System-on-a-Chip. Asian Test Symposium 2003: 418-423
	2002
5		Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich: A Mixed-Mode BIST Scheme Based on Folding Compression. J. Comput. Sci. Technol. 17(2): 203-212 (2002)
4		Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich: Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. J. Electronic Testing 18(2): 159-170 (2002)
	2001
3		Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich: Two-dimensional test data compression for scan-based deterministic BIST. ITC 2001: 894-902
2		Sybille Hellebrand, Huaguo Liang, Hans-Joachim Wunderlich: A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. J. Electronic Testing 17(3-4): 341-349 (2001)
	2000
1		Sybille Hellebrand, Hans-Joachim Wunderlich, Huaguo Liang: A mixed mode BIST scheme based on reseeding of folding counters. ITC 2000: 778-784

Coauthor Index

1	Tian Chen	[11]
2	Xiangsheng Fang	[7]
3	Sybille Hellebrand	[1] [2] [3] [4] [5]
4	Zhengfeng Huang	[8] [9] [10]
5	Cuiyun Jiang	[6] [7] [13] [14]
6	Huawei Li	[12]
7	Xiaowei Li	[12]
8	Qiang Luo	[13]
9	Yinghua Min	[12]
10	Feng Shi	[8] [9]
11	Jie Wang	[12]
12	Wei Wang	[11]
13	Hans-Joachim Wunderlich	[1] [2] [3] [4] [5]
14	Maoxiang Yi	[7] [14]
15	Kaihua Zhan	[14]
16	Wenfa Zhan	[8] [9] [13]
17	Minsheng Zhang	[11]

Colors in the list of coauthors