Jung-Cheun Lien

	1993
5		Jung-Cheun Lien, Melvin A. Breuer: Test program synthesis for modules and chips having boundary scan. J. Electronic Testing 4(2): 159-180 (1993)
	1991
4		Jung-Cheun Lien, Melvin A. Breuer: Maximal Diagnosis for Wiring Networks. ITC 1991: 96-105
3		Jung-Cheun Lien, Melvin A. Breuer: An optimal scheduling algorithm for testing interconnect using boundary scan. J. Electronic Testing 2(1): 117-130 (1991)
	1988
2		Sandeep K. Gupta, Melvin A. Breuer, Jung-Cheun Lien: Concurrent Control of Multiple BIT Structures. ITC 1988: 431-442
1		Melvin A. Breuer, Jung-Cheun Lien: A Test and Maintenance Controller for a Module Containing Testable Chips. ITC 1988: 502-513

Coauthor Index

1	Melvin A. Breuer	[1] [2] [3] [4] [5]
2	Sandeep K. Gupta	[2]