Michael R. Lightner Coauthor index DBLP Vis pubzone.org

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DBLP keys2006
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKatherine L. Morse, Michael R. Lightner, Reed Little, Bob Lutz, Roy Scrudder: Enabling Simulation Interoperability. IEEE Computer 39(1): 115-117 (2006)
2005
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJacob D. Griesbach, Michael R. Lightner, Delores M. Etter: Mean square error analysis of nonuniform subband adaptive filters for system modeling. IEEE Transactions on Signal Processing 53(2-1): 550-563 (2005)
1995
6no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMichael R. Lightner: Book Review: TeX in Practice by Stephan von Bechtolsheim. Operating Systems Review 29(1): 2-6 (1995)
1994
5no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMichael R. Lightner: Book Review: TeX in Practice by Stephan von Bechtolsheim. Operating Systems Review 28(2): 6-8 (1994)
1993
4no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMichael R. Lightner, Jochen A. G. Jess: Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993, Santa Clara, California, USA, November 7-11, 1993 IEEE Computer Society 1993
1984
3no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMichael R. Lightner, Gary D. Hachtel, Richard H. Byrd, Michel Heydemann: A Theory and Algorithmic Frame for Switch Level Simulation. IMACS European Simulation Meeting 1984: 151-159
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDale E. Hocevar, Michael R. Lightner, Timothy N. Trick: An Extrapolated Yield Approximation Technique for Use in Yield Maximization. IEEE Trans. on CAD of Integrated Circuits and Systems 3(4): 279-287 (1984)
1983
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDale E. Hocevar, Michael R. Lightner, Timothy N. Trick: A Study of Variance Reduction Techniques for Estimating Circuit Yields. IEEE Trans. on CAD of Integrated Circuits and Systems 2(3): 180-192 (1983)

Coauthor Index

1Richard H. Byrd [3]
2Delores M. Etter [7]
3Jacob D. Griesbach [7]
4Gary D. Hachtel [3]
5Michel Heydemann [3]
6Dale E. Hocevar [1] [2]
7Jochen A. G. Jess [4]
8Reed Little [8]
9Bob Lutz [8]
10Katherine L. Morse [8]
11Roy Scrudder [8]
12Timothy N. Trick [1] [2]

Colors in the list of coauthors

Copyright © Mon Nov 30 15:58:31 2009 by Michael Ley (ley@uni-trier.de)