Sen-Pin Lin

	1994
3		Sen-Pin Lin, Sandeep K. Gupta, Melvin A. Breuer: A Low Cost BIST Methodology and Associated Novel Test Pattern Generator. EDAC-ETC-EUROASIC 1994: 106-112
	1993
2		Sen-Pin Lin, Charles Njinda, Melvin A. Breuer: Generating a family of testable designs using the BILBO methodology. J. Electronic Testing 4(1): 71-89 (1993)
	1991
1		Sen-Pin Lin, Charles Njinda, Melvin A. Breuer: A Systematic Approach for Designing Testable VLSI Circuits. ICCAD 1991: 496-499

Coauthor Index

1	Melvin A. Breuer	[1] [2] [3]
2	Sandeep K. Gupta	[3]
3	Charles Njinda	[1] [2]