 | 2007 |
|---|
| 11 |       | You-Lin Wu,
Shi-Tin Lin,
Tsung-Min Chang,
Juin J. Liou:
Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy.
Microelectronics Reliability 47(2-3): 419-421 (2007) |
| 2006 |
|---|
| 10 | | Javier A. Salcedo,
Juin J. Liou,
Muhammad Yaqub Afridi,
Allen R. Hefner:
On-chip electrostatic discharge protection for CMOS gas sensor systems-on-a-chip (SoC).
Microelectronics Reliability 46(8): 1285-1294 (2006) |
| 2005 |
|---|
| 9 | | Javier A. Salcedo,
Juin J. Liou,
Muhammad Yaqub Afridi,
Allen R. Hefner:
Novel electrostatic discharge protection structure for a monolithic gas sensor systems-on-a-chip.
ISCAS (1) 2005: 416-419 |
| 8 | | C. S. Ho,
Kuo-Yin Huang,
Ming Tang,
Juin J. Liou:
An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect.
Microelectronics Reliability 45(7-8): 1144-1149 (2005) |
| 2003 |
|---|
| 7 | | Xiaofang Gao,
Juin J. Liou,
Joe Bernier,
Gregg Croft,
Waisum Wong,
Satya Vishwanathan:
Optimization of on-chip ESD protection structures for minimal parasitic capacitance.
Microelectronics Reliability 43(5): 725-733 (2003) |
| 2002 |
|---|
| 6 | | Xiaofang Gao,
Juin J. Liou,
Joe Bernier,
Gregg Croft,
Adelmo Ortiz-Conde:
Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(12): 1497-1502 (2002) |
| 5 | | Juin J. Liou,
R. Shireen,
Adelmo Ortiz-Conde,
F. J. García Sánchez,
Antonio Cerdeira,
Xiaofang Gao,
Xuecheng Zou,
C. S. Ho:
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs.
Microelectronics Reliability 42(3): 343-347 (2002) |
| 4 | | Adelmo Ortiz-Conde,
F. J. García Sánchez,
Juin J. Liou,
Antonio Cerdeira,
Magali Estrada,
Y. Yue:
A review of recent MOSFET threshold voltage extraction methods.
Microelectronics Reliability 42(4-5): 583-596 (2002) |
| 3 | | Juin J. Liou,
Qiang Zhang,
John McMacken,
J. Ross Thomson,
Kevin Stiles,
Paul Layman:
Statistical modeling of MOS devices for parametric yield prediction.
Microelectronics Reliability 42(4-5): 787-795 (2002) |
| 2001 |
|---|
| 2 | | F. Schwierz,
Juin J. Liou:
Semiconductor devices for RF applications: evolution and current status.
Microelectronics Reliability 41(2): 145-168 (2001) |
| 1994 |
|---|
| 1 | | W. W. Wong,
Juin J. Liou:
JFET circuit simulation using SPICE implemented with an improved model.
IEEE Trans. on CAD of Integrated Circuits and Systems 13(1): 105-109 (1994) |
