Meng-Yao Liu

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2005

2 Shaolei Quan, Meng-Yao Liu, Chin-Long Wey: Design of a CMOS Operational Amplifier Amenable to Extreme Voltage Stress. DFT 2005: 563-572

2004

1 Chin-Long Wey, Meng-Yao Liu: Burn-In Stress Test of Analog CMOS ICs. Asian Test Symposium 2004: 360-365

	2005
2		Shaolei Quan, Meng-Yao Liu, Chin-Long Wey: Design of a CMOS Operational Amplifier Amenable to Extreme Voltage Stress. DFT 2005: 563-572
	2004
1		Chin-Long Wey, Meng-Yao Liu: Burn-In Stress Test of Analog CMOS ICs. Asian Test Symposium 2004: 360-365

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