Frankie Low

	2006
2		Cher Ming Tan, Wei Li, Kok Tong Tan, Frankie Low: Development of highly accelerated electromigration test. Microelectronics Reliability 46(9-11): 1638-1642 (2006)
	2005
1		Cher Ming Tan, Arijit Roy, Kok Tong Tan, Derek Sim Kwang Ye, Frankie Low: Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects. Microelectronics Reliability 45(9-11): 1449-1454 (2005)

Coauthor Index

1	Wei Li	[2]
2	Arijit Roy	[1]
3	Cher Ming Tan	[1] [2]
4	Kok Tong Tan	[1] [2]
5	Derek Sim Kwang Ye	[1]