Joel Lurkins

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2006

1 Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware: Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Design & Test of Computers 23(2): 100-109 (2006)

	2006
1		Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware: Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Design & Test of Computers 23(2): 100-109 (2006)

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