Xianyun Ma

	2005
1		Toshiro Kubota, Parag Talekar, Xianyun Ma, Tangali S. Sudarshan: A nondestructive automated defect detection system for silicon carbide wafers. Mach. Vis. Appl. 16(3): 170-176 (2005)

Coauthor Index

1	Toshiro Kubota	[1]
2	Tangali S. Sudarshan	[1]
3	Parag Talekar	[1]