 | 2008 |
|---|
| 9 |       | Ameet Chavan,
Eric MacDonald,
Norman Liu,
Joseph Neff:
A novel floating gate circuit family with subthreshold voltage swing for ultra-low power operation.
ISCAS 2008: 3354-3357 |
| 2006 |
|---|
| 8 | | Eric MacDonald,
Nur A. Touba:
Delay testing of partially depleted silicon-on-insulator (PD-SOI) circuits.
IEEE Trans. VLSI Syst. 14(6): 587-595 (2006) |
| 2005 |
|---|
| 7 | | Didier Keymeulen,
Michael I. Ferguson,
Wolfgang Fink,
Boris Oks,
Chris Peay,
Richard Terrile,
Yen Cheng,
Dennis Kim,
Eric MacDonald,
David Foor:
Hardware Platforms for MEMS Gyroscope Tuning Based on Evolutionary Computation Using Open-Loop and Closed-Loop Frequency Response.
ICES 2005: 215-226 |
| 6 | | Kirti Joshi,
Eric MacDonald:
Reduction of Instantaneous Power by Ripple Scan Clocking.
VTS 2005: 271-276 |
| 2004 |
|---|
| 5 | | Shalini Ghosh,
Eric MacDonald,
Sugato Basu,
Nur A. Touba:
Low-power weighted pseudo-random BIST using special scan cells.
ACM Great Lakes Symposium on VLSI 2004: 86-91 |
| 4 | | R. Dean Adams,
Robert Abbott,
Xiaoliang Bai,
Dwayne Burek,
Eric MacDonald:
An Integrated Memory Self Test and EDA Solution.
MTDT 2004: 92-95 |
| 2002 |
|---|
| 3 | | Eric MacDonald,
Nur A. Touba:
Very Low Voltage Testing of SOI Integrated Circuits.
VTS 2002: 25-30 |
| 2000 |
|---|
| 2 | | Eric MacDonald,
Nur A. Touba:
Testing domino circuits in SOI technology.
Asian Test Symposium 2000: 441-446 |
| 1999 |
|---|
| 1 |  | Eric MacDonald,
Nur A. Touba:
Delay testing of SOI circuits: Challenges with the history effect.
ITC 1999: 269-275 |
