Remo G. Markgraf

	1992
2		Thomas M. Sarfert, Remo G. Markgraf, Michael H. Schulz, Erwin Trischler: A hierarchical test pattern generation system based on high-level primitives. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 34-44 (1992)
	1989
1		Thomas M. Sarfert, Remo G. Markgraf, Erwin Trischler, Michael H. Schulz: Hierarchical Test Pattern Generation Based on High-Level Primitives. ITC 1989: 470-479

Coauthor Index

1	Thomas M. Sarfert	[1] [2]
2	Michael H. Schulz	[1] [2]
3	Erwin Trischler	[1] [2]