Frank Mayer

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2000

4 Frank Mayer, Albrecht P. Stroele: A Versatile BIST Technique Combining Test Registers and Accumulators. VLSI Design 2000: 412-

1999

3 Albrecht P. Stroele, Frank Mayer: Test Scheduling with Loop Folding and Its Application to Test Configurations with Accumulators. Asian Test Symposium 1999: 101-106

1998

2 Frank Mayer, Albrecht P. Stroele: Configuring Arithmetic Pattern Generators and Response Compactors from the RT-Modules of a Circuit. Asian Test Symposium 1998: 15-20

1997

1 Albrecht P. Stroele, Frank Mayer: Methods to reduce test application time for accumulator-based self-test. VTS 1997: 48-53

	2000
4		Frank Mayer, Albrecht P. Stroele: A Versatile BIST Technique Combining Test Registers and Accumulators. VLSI Design 2000: 412-
	1999
3		Albrecht P. Stroele, Frank Mayer: Test Scheduling with Loop Folding and Its Application to Test Configurations with Accumulators. Asian Test Symposium 1999: 101-106
	1998
2		Frank Mayer, Albrecht P. Stroele: Configuring Arithmetic Pattern Generators and Response Compactors from the RT-Modules of a Circuit. Asian Test Symposium 1998: 15-20
	1997
1		Albrecht P. Stroele, Frank Mayer: Methods to reduce test application time for accumulator-based self-test. VTS 1997: 48-53

Coauthor Index

1 Albrecht P. Stroele [1] [2] [3] [4]