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DBLP keys2009
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. Venkatraman, R. Castagnetti, Andres Teene, Benjamin Mbouombouo, S. Ramesh: Power & variability test chip architecture and 45nm-generation silicon-based analysis for robust, power-aware SoC design. ISQED 2009: 27-32

Coauthor Index

1R. Castagnetti [1]
2S. Ramesh (Sethu Ramesh) [1]
3Andres Teene [1]
4R. Venkatraman [1]

Copyright © Mon Dec 21 17:44:35 2009 by Michael Ley (ley@uni-trier.de)