Kevin McCauley Coauthor index DBLP Vis pubzone.org

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DBLP keys2005
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVivek Chickermane, Brion L. Keller, Kevin McCauley, Anis Uzzaman: Practical Aspects of Delay Testing for Nanometer Chips. Asian Test Symposium 2005: 470
2004
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPamela S. Gillis, Francis Woytowich, Andrew Ferko, Kevin McCauley: Low Overhead Delay Testing of ASICS. ITC 2004: 534-542
1998
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBrion L. Keller, Kevin McCauley, Joseph Swenton, James Youngs: ATPG in practical and non-traditional applications. ITC 1998: 632-640
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPamela S. Gillis, Francis Woytowich, Kevin McCauley, Ulrich Baur: Delay test of chip I/Os using LSSD boundary scan. ITC 1998: 83-90
1992
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBernd Könemann, J. Barlow, Paul Chang, R. Gabrielson, C. Goertz, Brion L. Keller, Kevin McCauley, J. Tischer, Vijay S. Iyengar, Barry K. Rosen, T. Williams: Delay Test: The Next Frontier for LSSD Test Systems. ITC 1992: 578-587

Coauthor Index

1J. Barlow [1]
2Ulrich Baur [2]
3Paul Chang [1]
4Vivek Chickermane [5]
5Andrew Ferko [4]
6R. Gabrielson [1]
7Pamela S. Gillis [2] [4]
8C. Goertz [1]
9Vijay S. Iyengar [1]
10Brion L. Keller [1] [3] [5]
11Bernd Könemann [1]
12Barry K. Rosen [1]
13Joseph Swenton [3]
14J. Tischer [1]
15Anis Uzzaman [5]
16T. Williams [1]
17Francis Woytowich [2] [4]
18James Youngs [3]

Copyright © Mon Dec 7 15:48:47 2009 by Michael Ley (ley@uni-trier.de)