 | 2009 |
|---|
| 7 |       | Mesut Meterelliyoz,
Kaushik Roy:
Design for burn-in test: a technique for burn-in thermal stability under die-to-die parameter variations.
ASP-DAC 2009: 787-792 |
| 6 | | Rouwaida Kanj,
Rajiv V. Joshi,
Jente B. Kuang,
J. Kim,
Mesut Meterelliyoz,
W. Reohr,
Sani R. Nassif,
Kevin J. Nowka:
Statistical yield analysis of silicon-on-insulator embedded DRAM.
ISQED 2009: 190-194 |
| 2008 |
|---|
| 5 | | Mesut Meterelliyoz,
Jaydeep P. Kulkarni,
Kaushik Roy:
Thermal analysis of 8-T SRAM for nano-scaled technologies.
ISLPED 2008: 123-128 |
| 2007 |
|---|
| 4 | | Jung Hwan Choi,
Aditya Bansal,
Mesut Meterelliyoz,
Jayathi Murthy,
Kaushik Roy:
Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(11): 2059-2068 (2007) |
| 2006 |
|---|
| 3 | | Aditya Bansal,
Mesut Meterelliyoz,
Siddharth Singh,
Jung Hwan Choi,
Jayathi Murthy,
Kaushik Roy:
Compact thermal models for estimation of temperature-dependent power/performance in FinFET technology.
ASP-DAC 2006: 237-242 |
| 2 | | Jung Hwan Choi,
Aditya Bansal,
Mesut Meterelliyoz,
Jayathi Murthy,
Kaushik Roy:
Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits.
ICCAD 2006: 583-586 |
| 1 | | Qikai Chen,
Mesut Meterelliyoz,
Kaushik Roy:
A CMOS Thermal Sensor and Its Applications in Temperature Adaptive Design.
ISQED 2006: 243-248 |
