 | 2010 |
| 10 |  | Ruijing Shen,
Sheldon X.-D. Tan,
Ning Mi,
Yici Cai:
Statistical modeling and analysis of chip-level leakage power by spectral stochastic method.
Integration 43(1): 156-165 (2010) |
| 2009 |
| 9 |  | Ruijing Shen,
Ning Mi,
Sheldon X.-D. Tan,
Yici Cai,
Xianlong Hong:
Statistical modeling and analysis of chip-level leakage power by spectral stochastic method.
ASP-DAC 2009: 161-166 |
| 8 |  | Thom Jefferson A. Eguia,
Ning Mi,
Sheldon X.-D. Tan:
Statistical decoupling capacitance allocation by efficient numerical quadrature method.
ISQED 2009: 309-316 |
| 7 |  | Ning Mi,
Sheldon X.-D. Tan,
Boyuan Yan:
Multiple block structure-preserving reduced order modeling of interconnect circuits.
Integration 42(2): 158-168 (2009) |
| 2008 |
| 6 |  | Ning Mi,
Sheldon X.-D. Tan,
Yici Cai,
Xianlong Hong:
Fast Variational Analysis of On-Chip Power Grids by Stochastic Extended Krylov Subspace Method.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(11): 1996-2006 (2008) |
| 2007 |
| 5 |  | Jeffrey Fan,
Ning Mi,
Sheldon X.-D. Tan,
Yici Cai,
Xianlong Hong:
Statistical model order reduction for interconnect circuits considering spatial correlations.
DATE 2007: 1508-1513 |
| 4 |  | Ning Mi,
Sheldon X.-D. Tan,
Pu Liu,
Jian Cui,
Yici Cai,
Xianlong Hong:
Stochastic extended Krylov subspace method for variational analysis of on-chip power grid networks.
ICCAD 2007: 48-53 |
| 3 |  | Jeffrey Fan,
Ning Mi,
Sheldon X.-D. Tan:
Voltage drop reduction for on-chip power delivery considering leakage current variations.
ICCD 2007: 78-83 |
| 2 |  | Ning Mi,
Boyuan Yan,
Sheldon X.-D. Tan,
Jeffrey Fan,
Hao Yu:
General Block Structure-Preserving Reduced Order Modeling of Linear Dynamic Circuits.
ISQED 2007: 633-638 |
| 2006 |
| 1 |  | Ning Mi,
Jeffrey Fan,
Sheldon X.-D. Tan:
Statistical Analysis of Power Grid Networks Considering Lognormal Leakage Current Variations with Spatial Correlation.
ICCD 2006 |