Yoan Miche

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2007
2EEYoan Miche, Patrick Bas, Amaury Lendasse, Christian Jutten, Olli Simula: Advantages of Using Feature Selection Techniques on Steganalysis Schemes. IWANN 2007: 606-613
2006
1EEYoan Miche, Benoit Roue, Amaury Lendasse, Patrick Bas: A Feature Selection Methodology for Steganalysis. MRCS 2006: 49-56

Coauthor Index

1Patrick Bas [1] [2]
2Christian Jutten [2]
3Amaury Lendasse [1] [2]
4Benoit Roue [1]
5Olli Simula [2]

Copyright © Fri Sep 5 16:23:00 2008 by Michael Ley (ley@uni-trier.de)