Tom Middleton

	1985
3		Tom Middleton: Recycling Functional Test Vectors: Techniques and Tools for Pattern Conversion. ITC 1985: 291-303
	1984
2		S. Daniel Lee, Tom Middleton: Behavioral Simulation of VLSI Test System Aids Debugging and Analysis of Test Programs. ITC 1984: 614-620
	1983
1		Tom Middleton: Functional Test Vector Generation for Digital LSI/VLSI Devices. ITC 1983: 682-691

Coauthor Index

1

S. Daniel Lee

[2]