L. Miler

	1997
1		Chieh-Yuan Chao, Hung-Jen Lin, L. Miler: Optimal testing of VLSI analog circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 16(1): 58-77 (1997)

Coauthor Index

1	Chieh-Yuan Chao	[1]
2	Hung-Jen Lin	[1]