| 2008 |
|---|
| 67 | EE | Tze Wee Chen,
Kyunglok Kim,
Young Moon Kim,
Subhasish Mitra:
Gate-Oxide Early Life Failure Prediction.
VTS 2008: 111-118 |
| 66 | EE | Rohit Kapur,
Subhasish Mitra,
Thomas W. Williams:
Historical Perspective on Scan Compression.
IEEE Design & Test of Computers 25(2): 114-120 (2008) |
| 2007 |
|---|
| 65 | EE | Nishant Patil,
Jie Deng,
H.-S. Philip Wong,
Subhasish Mitra:
Automated Design of Misaligned-Carbon-Nanotube-Immune Circuits.
DAC 2007: 958-961 |
| 64 | EE | Sanjit A. Seshia,
Wenchao Li,
Subhasish Mitra:
Verification-guided soft error resilience.
DATE 2007: 1442-1447 |
| 63 | EE | Subhasish Mitra:
Circuit Failure Prediction Enables Robust System Design Resilient to Aging and Wearout.
IOLTS 2007: 123 |
| 62 | EE | Subhasish Mitra,
Pia Sanda,
Norbert Seifert:
Soft Errors: Technology Trends, System Effects, and Protection Techniques.
IOLTS 2007: 4 |
| 61 | EE | Mridul Agarwal,
Bipul C. Paul,
Ming Zhang,
Subhasish Mitra:
Circuit Failure Prediction and Its Application to Transistor Aging.
VTS 2007: 277-286 |
| 60 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra:
Application-Dependent Delay Testing of FPGAs.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(3): 553-563 (2007) |
| 2006 |
|---|
| 59 | EE | T. M. Mak,
Subhasish Mitra:
Should Logic SER be Solved at the Circuit Level?
IOLTS 2006: 199 |
| 58 | EE | Bob Mungamuru,
Hector Garcia-Molina,
Subhasish Mitra:
How To Safeguard Your Sensitive Data.
SRDS 2006: 199-211 |
| 57 | EE | Subhasish Mitra,
Ming Zhang,
Norbert Seifert,
T. M. Mak,
Kee Sup Kim:
Soft Error Resilient System Design through Error Correction.
VLSI-SoC 2006: 332-337 |
| 56 | EE | Ruifeng Guo,
Subhasish Mitra,
Enamul Amyeen,
Jinkyu Lee,
Srihari Sivaraj,
Srikanth Venkataraman:
Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive.
VTS 2006: 66-71 |
| 55 | EE | Subhasish Mitra,
Kee Sup Kim:
XPAND: An Efficient Test Stimulus Compression Technique.
IEEE Trans. Computers 55(2): 163-173 (2006) |
| 54 | EE | Ming Zhang,
Subhasish Mitra,
T. M. Mak,
Norbert Seifert,
N. J. Wang,
Quan Shi,
Kee Sup Kim,
Naresh R. Shanbhag,
S. J. Patel:
Sequential Element Design With Built-In Soft Error Resilience.
IEEE Trans. VLSI Syst. 14(12): 1368-1378 (2006) |
| 2005 |
|---|
| 53 | EE | Erik H. Volkerink,
Subhasish Mitra:
Response compaction with any number of unknowns using a new LFSR architecture.
DAC 2005: 117-122 |
| 52 | EE | Subhasish Mitra,
Tanay Karnik,
Norbert Seifert,
Ming Zhang:
Logic soft errors in sub-65nm technologies design and CAD challenges.
DAC 2005: 2-4 |
| 51 | EE | T. M. Mak,
Subhasish Mitra,
Ming Zhang:
DFT Assisted Built-In Soft Error Resilience.
IOLTS 2005: 69 |
| 50 | EE | R. D. (Shawn) Blanton,
Subhasish Mitra:
Testing Nanometer Digital Integration Circuits: Myths, Reality and the Road Ahead.
VLSI Design 2005: 8-9 |
| 49 | EE | Subhasish Mitra,
Norbert Seifert,
Ming Zhang,
Quan Shi,
Kee Sup Kim:
Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim.
IEEE Computer 38(2): 43-52 (2005) |
| 48 | EE | Subhasish Mitra,
Steven S. Lumetta,
Michael Mitzenmacher,
Nishant Patil:
X-Tolerant Test Response Compaction.
IEEE Design & Test of Computers 22(6): 566-574 (2005) |
| 47 | EE | Ravishankar K. Iyer,
Nithin Nakka,
Zbigniew Kalbarczyk,
Subhasish Mitra:
Recent Advances and New Avenues in Hardware-Level Reliability Support.
IEEE Micro 25(6): 18-29 (2005) |
| 46 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra:
Application-independent testing of FPGA interconnects.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(11): 1774-1783 (2005) |
| 45 | EE | Ahmad A. Al-Yamani,
Subhasish Mitra,
Edward J. McCluskey:
Optimized reseeding by seed ordering and encoding.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(2): 264-270 (2005) |
| 2004 |
|---|
| 44 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra:
Defect and Fault Tolerance of Reconfigurable Molecular Computing.
FCCM 2004: 176-185 |
| 43 | EE | Kenneth A. Brand,
Erik H. Volkerink,
Edward J. McCluskey,
Subhasish Mitra:
Speed Clustering of Integrated Circuits.
ITC 2004: 1128-1137 |
| 42 | EE | Subhasish Mitra,
Steven S. Lumetta,
Michael Mitzenmacher:
X-Tolerant Signature Analysis.
ITC 2004: 432-441 |
| 41 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra:
Interconnect Delay Testing of Designs on Programmable Logic Devices.
ITC 2004: 635-644 |
| 40 | EE | Edward J. McCluskey,
Ahmad A. Al-Yamani,
Chien-Mo James Li,
Chao-Wen Tseng,
Erik H. Volkerink,
François-Fabien Ferhani,
Edward Li,
Subhasish Mitra:
ELF-Murphy Data on Defects and Test Sets.
VTS 2004: 16-22 |
| 39 | EE | Subhasish Mitra,
Erik H. Volkerink,
Edward J. McCluskey,
Stefan Eichenberger:
Delay Defect Screening using Process Monitor Structures.
VTS 2004: 43-52 |
| 38 | EE | Subhasish Mitra,
Wei-Je Huang,
Nirmal R. Saxena,
Shu-Yi Yu,
Edward J. McCluskey:
Reconfigurable Architecture for Autonomous Self-Repair.
IEEE Design & Test of Computers 21(3): 228-240 (2004) |
| 37 | EE | Vladimir Hahanov,
Raimund Ubar,
Subhasish Mitra:
Conference Reports.
IEEE Design & Test of Computers 21(6): 594-595 (2004) |
| 36 | EE | Subhasish Mitra,
Nirmal R. Saxena,
Edward J. McCluskey:
Efficient Design Diversity Estimation for Combinational Circuits.
IEEE Trans. Computers 53(11): 1483-1492 (2004) |
| 35 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra:
Techniques and algorithms for fault grading of FPGA interconnect test configurations.
IEEE Trans. on CAD of Integrated Circuits and Systems 23(2): 261-272 (2004) |
| 34 | EE | Subhasish Mitra,
Kee Sup Kim:
X-compact: an efficient response compaction technique.
IEEE Trans. on CAD of Integrated Circuits and Systems 23(3): 421-432 (2004) |
| 2003 |
|---|
| 33 | EE | Subhasish Mitra,
Kee Sup Kim:
XMAX: X-Tolerant Architecture for MAXimal Test Compression.
ICCD 2003: 326-330 |
| 32 | EE | David M. Wu,
Mike Lin,
Subhasish Mitra,
Kee Sup Kim,
Anil Sabbavarapu,
Talal Jaber,
Pete Johnson,
Dale March,
Greg Parrish:
H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing.
ITC 2003: 1229-1238 |
| 31 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra:
Automatic Configuration Generation for FPGA Interconnect Testing.
VTS 2003: 134-144 |
| 30 | EE | Erik H. Volkerink,
Subhasish Mitra:
Efficient Seed Utilization for Reseeding based Compression.
VTS 2003: 232-240 |
| 29 | EE | Ahmad A. Al-Yamani,
Subhasish Mitra,
Edward J. McCluskey:
Bist Reseeding with very few Seeds.
VTS 2003: 69-76 |
| 28 | EE | Kee Sup Kim,
Subhasish Mitra,
Paul G. Ryan:
Delay Defect Characteristics and Testing Strategies.
IEEE Design & Test of Computers 20(5): 8-16 (2003) |
| 2002 |
|---|
| 27 | EE | Ahmad A. Al-Yamani,
Subhasish Mitra,
Edward J. McCluskey:
Testing Digital Circuits with Constraints.
DFT 2002: 195-206 |
| 26 | EE | Subhasish Mitra,
Edward J. McCluskey:
Dependable Reconfigurable Computing Design Diversity and Self Repair.
Evolvable Hardware 2002: 5 |
| 25 | EE | Erik H. Volkerink,
Ajay Khoche,
Subhasish Mitra:
Packet-Based Input Test Data Compression Techniques.
ITC 2002: 154-163 |
| 24 | EE | Subhasish Mitra,
Kee Sup Kim:
X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction.
ITC 2002: 311-320 |
| 23 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra,
Shahin Toutounchi,
Edward J. McCluskey:
Fault Grading FPGA Interconnect Test Configurations.
ITC 2002: 608-617 |
| 22 | EE | Subhasish Mitra,
Edward J. McCluskey,
Samy Makar:
Design for Testability and Testing of IEEE 1149.1 Tap Controller.
VTS 2002: 247-252 |
| 21 | EE | Edward J. McCluskey,
Subhasish Mitra,
Bob Madge,
Peter C. Maxwell,
Phil Nigh,
Mike Rodgers:
Debating the Future of Burn-In.
VTS 2002: 311-314 |
| 20 | EE | Ajay Khoche,
Erik H. Volkerink,
Jochen Rivoir,
Subhasish Mitra:
Test Vector Compression Using EDA-ATE Synergies.
VTS 2002: 97-102 |
| 19 | EE | Nahmsuk Oh,
Subhasish Mitra,
Edward J. McCluskey:
ED4I: Error Detection by Diverse Data and Duplicated Instructions.
IEEE Trans. Computers 51(2): 180-199 (2002) |
| 18 | EE | Subhasish Mitra,
Nirmal R. Saxena,
Edward J. McCluskey:
A Design Diversity Metric and Analysis of Redundant Systems.
IEEE Trans. Computers 51(5): 498-510 (2002) |
| 2001 |
|---|
| 17 | EE | Wei-Je Huang,
Subhasish Mitra,
Edward J. McCluskey:
Fast Run-Time Fault Location in Dependable FPGA-Based Applications.
DFT 2001: 206-214 |
| 16 | EE | Subhasish Mitra,
Nirmal R. Saxena,
Edward J. McCluskey:
Techniques for Estimation of Design Diversity for Combinational Logic Circuits.
DSN 2001: 25-36 |
| 15 | EE | Subhasish Mitra,
Edward J. McCluskey:
Diversity Techniques for Concurrent Error Detection.
ISQED 2001: 249-250 |
| 14 | EE | Subhasish Mitra,
Edward J. McCluskey:
Design Diversity for Concurrent Error Detection in Sequential Logic Circuts.
VTS 2001: 178-183 |
| 13 | EE | Subhasish Mitra,
Edward J. McCluskey:
Design of Redundant Systems Protected Against Common-Mode Failures.
VTS 2001: 190-197 |
| 12 | EE | Chao-Wen Tseng,
Subhasish Mitra,
Edward J. McCluskey,
Scott Davidson:
An Evaluation of Pseudo Random Testing for Detecting Real Defects.
VTS 2001: 404-410 |
| 2000 |
|---|
| 11 | EE | Philip P. Shirvani,
Subhasish Mitra,
Jo C. Ebergen,
Marly Roncken:
DUDES: A Fault Abstraction and Collapsing Framework for Asynchronous Circuits.
ASYNC 2000: 73- |
| 10 | | Subhasish Mitra,
Edward J. McCluskey:
Combinational logic synthesis for diversity in duplex systems.
ITC 2000: 179-188 |
| 9 | | Subhasish Mitra,
Edward J. McCluskey:
Which concurrent error detection scheme to choose ?
ITC 2000: 985-994 |
| 8 | EE | Subhasish Mitra,
Nirmal R. Saxena,
Edward J. McCluskey:
Fault Escapes in Duplex Systems.
VTS 2000: 453-458 |
| 7 | EE | Subhasish Mitra,
Edward J. McCluskey:
Word Voter: A New Voter Design for Triple Modular Redundant Systems.
VTS 2000: 465-470 |
| 6 | EE | Nirmal R. Saxena,
Santiago Fernández-Gomez,
Wei-Je Huang,
Subhasish Mitra,
Shu-Yi Yu,
Edward J. McCluskey:
Dependable Computing and Online Testing in Adaptive and Configurable Systems.
IEEE Design & Test of Computers 17(1): 29-41 (2000) |
| 5 | EE | Subhasish Mitra,
LaNae J. Avra,
Edward J. McCluskey:
Efficient Multiplexer Synthesis Techniques.
IEEE Design & Test of Computers 17(4): 90-97 (2000) |
| 1999 |
|---|
| 4 | | Subhasish Mitra,
Nirmal R. Saxena,
Edward J. McCluskey:
A design diversity metric and reliability analysis for redundant systems.
ITC 1999: 662-671 |
| 3 | EE | Subhasish Mitra,
LaNae J. Avra,
Edward J. McCluskey:
An output encoding problem and a solution technique.
IEEE Trans. on CAD of Integrated Circuits and Systems 18(6): 761-768 (1999) |
| 1997 |
|---|
| 2 | EE | Subhasish Mitra,
LaNae J. Avra,
Edward J. McCluskey:
An output encoding problem and a solution technique.
ICCAD 1997: 304-307 |
| 1 | | Subhasish Mitra,
LaNae J. Avra,
Edward J. McCluskey:
Scan Synthesis for One-Hot Signals.
ITC 1997: 714-722 |
