 | 2005 |
|---|
| 3 |       | Hiroshi Miyamoto,
Shinichi Iiyama,
Hiroyuki Tomiyama,
Hiroaki Takada,
Hiroshi Nakashima:
An Efficient Search Algorithm of Worst-Case Cache Flush Timings.
RTCSA 2005: 45-52 |
| 1991 |
|---|
| 2 |  | Yoshikazu Morooka,
Shigeru Mori,
Hiroshi Miyamoto,
Michihiro Yamada:
An Address Maskable Parallel Testing for Ultra High Density DRAMs.
ITC 1991: 556-563 |
| 1985 |
|---|
| 1 | | Hiroshi Miyamoto,
Koichiro Mashiko,
Yoshikazu Morooka,
Kazutami Arimoto,
Michihiro Yamada,
T. Nakano:
Test Pattern Considerations for Fault Tolerant High Density DRAM.
ITC 1985: 451-455 |
