| 2005 | ||
|---|---|---|
| 1 | EE | Darren Aaberge, Ken Mockler, Dieu Van Dinh, Raoul Belleau, Tim Donovan, Reid Hewlitt: Meeting the Test Challenges of the 1 Gbps Parallel RapidIO Interface with New Automatic Test Equipment Capabilities. VTS 2005: 75-84 |
| 1 | Darren Aaberge | [1] |
| 2 | Raoul Belleau | [1] |
| 3 | Dieu Van Dinh | [1] |
| 4 | Tim Donovan | [1] |
| 5 | Reid Hewlitt | [1] |