Yoshikazu Morooka

	2009
3		Masaru Haraguchi, Tokuya Osawa, Akira Yamazaki, Chikayoshi Morishima, Toshinori Morihara, Yoshikazu Morooka, Yoshihiro Okuno, Kazutami Arimoto: A Continuous-Adaptive DDRx Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test. IEICE Transactions 92-C(4): 453-459 (2009)
	1991
2		Yoshikazu Morooka, Shigeru Mori, Hiroshi Miyamoto, Michihiro Yamada: An Address Maskable Parallel Testing for Ultra High Density DRAMs. ITC 1991: 556-563
	1985
1		Hiroshi Miyamoto, Koichiro Mashiko, Yoshikazu Morooka, Kazutami Arimoto, Michihiro Yamada, T. Nakano: Test Pattern Considerations for Fault Tolerant High Density DRAM. ITC 1985: 451-455

Coauthor Index

1	Kazutami Arimoto	[1] [3]
2	Masaru Haraguchi	[3]
3	Koichiro Mashiko	[1]
4	Hiroshi Miyamoto	[1] [2]
5	Shigeru Mori	[2]
6	Toshinori Morihara	[3]
7	Chikayoshi Morishima	[3]
8	T. Nakano	[1]
9	Yoshihiro Okuno	[3]
10	Tokuya Osawa	[3]
11	Michihiro Yamada	[1] [2]
12	Akira Yamazaki	[3]