Nilanjan Mukherjee

	2009
34		Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: Defect Aware to Power Conscious Tests - The New DFT Landscape. VLSI Design 2009: 23-25
33		Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: High-Speed On-Chip Event Counters for Embedded Systems. VLSI Design 2009: 275-280
	2008
32		Nilanjan Mukherjee: Targeting "Zero DPPM" - Can we ever get there? DFT 2008: 163-163
	2007
31		Radhika Vurputoor, Nilanjan Mukherjee, Jean Cabello, Michael J. Hancock: A Mesh Morphing Technique For Geometrically Dissimilar Tessellated Surfaces. IMR 2007: 315-334
30		Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai: X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis. IEEE Design & Test of Computers 24(5): 476-485 (2007)
	2006
29		Nilanjan Mukherjee: High Quality Bi-Linear Transfinite Meshing with Interior Point Constraints. IMR 2006: 309-323
28		Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: High Performance Dense Ring Generators. IEEE Trans. Computers 55(1): 83-87 (2006)
	2005
27		Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press: Achieving High Test Quality with Reduced Pin Count Testing. Asian Test Symposium 2005: 312-317
26		Nilanjan Mukherjee: Improving Test Quality Using Test Data Compression. Asian Test Symposium 2005: 463
	2004
25		Nilanjan Mukherjee: Cost of Test - Taking Control. ITC 2004: 1431
24		Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer, Thomas Rinderknecht: Embedded Test for Low Cost Manufacturing. VLSI Design 2004: 21-23
23		Xiaogang Du, Sudhakar M. Reddy, Wu-Tung Cheng, Joseph Rayhawk, Nilanjan Mukherjee: At-Speed Built-in Self-Repair Analyzer for Embedded Word-Oriented Memories. VLSI Design 2004: 895-900
22		Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: Planar High Performance Ring Generators. VTS 2004: 193-198
21		Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee: Embedded deterministic test. IEEE Trans. on CAD of Integrated Circuits and Systems 23(5): 776-792 (2004)
	2003
20		Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanjan Mukherjee, Sudhakar M. Reddy: Static Pin Mapping and SOC Test Scheduling for Cores with Multiple Test Sets. ISQED 2003: 99-104
19		Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski: Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. ITC 2003: 1211-1220
18		Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing. IEEE Design & Test of Computers 20(5): 58-66 (2003)
	2002
17		Nilanjan Mukherjee: A Hybrid, Variational 3D Smoother For Orphaned Shell Meshes. IMR 2002: 379-390
16		Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310
15		Yu Huang, Sudhakar M. Reddy, Wu-Tung Cheng, Paul Reuter, Nilanjan Mukherjee, Chien-Chung Tsai, Omer Samman, Yahya Zaidan: Optimal Core Wrapper Width Selection and SOC Test Scheduling Based on 3-D Bin Packing Algorithm. ITC 2002: 74-82
14		Yu Huang, Nilanjan Mukherjee, Chien-Chung Tsai, Omer Samman, Yahya Zaidan, Yanping Zhang, Wu-Tung Cheng, Sudhakar M. Reddy: Constraint Driven Pin Mapping for Concurrent SOC Testing. VLSI Design 2002: 511-516
13		Yu Huang, Chien-Chung Tsai, Nilanjan Mukherjee, Omer Samman, Wu-Tung Cheng, Sudhakar M. Reddy: Synthesis of Scan Chains for Netlist Descriptions at RT-Level. J. Electronic Testing 18(2): 189-201 (2002)
12		Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanjan Mukherjee, Omer Samman, Yahya Zaidan, Sudhakar M. Reddy: On Concurrent Test of Core-Based SOC Design. J. Electronic Testing 18(4-5): 401-414 (2002)
	2001
11		Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanjan Mukherjee, Omer Samman, Yahya Zaidan, Sudhakar M. Reddy: Resource Allocation and Test Scheduling for Concurrent Test of Core-Based SoC D. Asian Test Symposium 2001: 265-
10		Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: Testing Schemes for FIR Filter Structures. IEEE Trans. Computers 50(7): 674-688 (2001)
	1998
9		Nilanjan Mukherjee, Tapan J. Chakraborty, Sudipta Bhawmik: A BIST scheme for the detection of path-delay faults. ITC 1998: 422-
8		Ramesh Karri, Nilanjan Mukherjee: Versatile BIST: an integrated approach to on-line/off-line BIST. ITC 1998: 910-917
7		Nilanjan Mukherjee, Ramesh Karri: Versatile BIST: An Integrated Approach to On-line/Off-line BIST for Data-Dominated Architectures. J. Electronic Testing 13(2): 189-200 (1998)
	1997
6		Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: Parameterizable Testing Scheme for FIR Filters. ITC 1997: 694-703
5		Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: Design of Testable Multipliers for Fixed-Width Data Paths. IEEE Trans. Computers 46(7): 795-810 (1997)
	1995
4		Mark Kassab, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: Software Accelerated Functional Fault Simulation for Data-Path Architectures. DAC 1995: 333-338
3		Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: On testable multipliers for fixed-width data path architectures. ICCAD 1995: 541-547
2		Nilanjan Mukherjee, H. Kassab, Janusz Rajski, Jerzy Tyszer: Arithmetic built-in self test for high-level synthesis. VTS 1995: 132-139
	1993
1		Thomas Charles Wilson, Nilanjan Mukherjee, M. K. Garg, Dilip K. Banerji: An Integrated and Accelerated ILP Solution for Scheduling, Module Allocation, and Binding in Datapath Synthesis. VLSI Design 1993: 192-197

Coauthor Index

1	Ralf Arnold	[19]
2	Dilip K. Banerji	[1]
3	Matthias Beck	[19]
4	Sudipta Bhawmik	[9]
5	Jean Cabello	[31]
6	Tapan J. Chakraborty	[9]
7	Wu-Tung Cheng	[11] [12] [13] [14] [15] [20] [23] [27] [30]
8	Xiaogang Du	[23]
9	Geir Eide	[16]
10	M. K. Garg	[1]
11	Michael J. Hancock	[31]
12	Andre Hertwig	[16]
13	Yu Huang	[11] [12] [13] [14] [15] [20]
14	Jay Jahangiri	[27]
15	Ramesh Karri	[7] [8]
16	H. Kassab	[2]
17	Mark Kassab	[4] [16] [18] [19] [21] [30]
18	Liyang Lai	[30]
19	Subramanian Mahadevan	[27]
20	Grzegorz Mrugalski	[16] [22] [28] [30]
21	Peter Muhmenthaler	[19]
22	Frank Poehl	[19]
23	Artur Pogiel	[33]
24	Ron Press	[27]
25	Jun Qian	[16] [18]
26	Janusz Rajski	[2] [3] [4] [5] [6] [10] [16] [18] [19] [21] [22] [24] [28] [30] [33] [34]
27	Joseph Rayhawk	[23]
28	Sudhakar M. Reddy	[11] [12] [13] [14] [15] [20] [23]
29	Paul Reuter	[15]
30	Thomas Rinderknecht	[24]
31	Omer Samman	[11] [12] [13] [14] [15]
32	Manish Sharma	[30]
33	Nagesh Tamarapalli	[16] [18] [19]
34	Rob Thompson	[16]
35	Chien-Chung Tsai	[11] [12] [13] [14] [15] [20]
36	Kun-Han Tsai	[16]
37	Jerzy Tyszer	[2] [3] [4] [5] [6] [10] [16] [18] [21] [22] [24] [28] [30] [33] [34]
38	Radhika Vurputoor	[31]
39	Thomas Charles Wilson	[1]
40	Yahya Zaidan	[11] [12] [14] [15]
41	Yanping Zhang	[14]

Colors in the list of coauthors