| 2009 | ||
|---|---|---|
| 51 | Minki Cho, Jason Schlessman, Wayne Wolf, Saibal Mukhopadhyay: Accuracy-aware SRAM: a reconfigurable low power SRAM architecture for mobile multimedia applications. ASP-DAC 2009: 823-828 | |
| 50 | Jeremy R. Tolbert, Saibal Mukhopadhyay: Accurate buffer modeling with slew propagation in subthreshold circuits. ISQED 2009: 91-96 | |
| 2008 | ||
| 49 | Somnath Paul, Saibal Mukhopadhyay, Swarup Bhunia: Hybrid CMOS-STTRAM non-volatile FPGA: design challenges and optimization approaches. ICCAD 2008: 589-592 | |
| 48 | Aditya Bansal, Rama N. Singh, Saibal Mukhopadhyay, Geng Han, Fook-Luen Heng, Ching-Te Chuang: Pre-Si estimation and compensation of SRAM layout deficiencies to achieve target performance and yield. ICCD 2008: 457-462 | |
| 47 | Saibal Mukhopadhyay, Rahul M. Rao, Jae-Joon Kim, Ching-Te Chuang: Capacitive coupling based transient negative bit-line voltage (Tran-NBL) scheme for improving write-ability of SRAM design in nanometer technologies. ISCAS 2008: 384-387 | |
| 46 | Saibal Mukhopadhyay, Rajiv V. Joshi, Keunwoo Kim, Ching-Te Chuang: Variability Analysis for sub-100nm PD/SOI Sense-Amplifier. ISQED 2008: 488-491 | |
| 45 | Aditya Bansal, Jae-Joon Kim, Keunwoo Kim, Saibal Mukhopadhyay, Ching-Te Chuang, Kaushik Roy: Optimal Dual-VT Design in Sub-100 Nanometer PDSOI and Double-Gate Technologies. VLSI Design 2008: 125-130 | |
| 44 | Niladri Narayan Mojumder, Saibal Mukhopadhyay, Jae-Joon Kim, Ching-Te Chuang, Kaushik Roy: Design and Analysis of a Self-Repairing SRAM with On-Chip Monitor and Compensation Circuitry. VTS 2008: 101-106 | |
| 43 | Animesh Datta, Swarup Bhunia, Jung Hwan Choi, Saibal Mukhopadhyay, Kaushik Roy: Profit Aware Circuit Design Under Process Variations Considering Speed Binning. IEEE Trans. VLSI Syst. 16(7): 806-815 (2008) | |
| 42 | Saibal Mukhopadhyay, Hamid Mahmoodi, Kaushik Roy: Reduction of Parametric Failures in Sub-100-nm SRAM Array Using Body Bias. IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 174-183 (2008) | |
| 2007 | ||
| 41 | Saibal Mukhopadhyay, Qikai Chen, Kaushik Roy: Memories in Scaled Technologies: A Review of Process Induced Failures, Test Methodologies, and Fault Tolerance. DDECS 2007: 69-74 | |
| 40 | Saibal Mukhopadhyay, Keunwoo Kim, Ching-Te Chuang: Design and analysis of Thin-BOX FD/SOI devices for low-power and stable SRAM in sub-50nm technologies. ISLPED 2007: 20-25 | |
| 39 | Swarup Bhunia, Saibal Mukhopadhyay, Kaushik Roy: Process Variations and Process-Tolerant Design. VLSI Design 2007: 699-704 | |
| 38 | Animesh Datta, Swarup Bhunia, Saibal Mukhopadhyay, Nilanjan Banerjee, Kaushik Roy: Statistical Modeling of Pipeline Delay and Design of Pipeline under Process Variation to Enhance Yield in sub-100nm Technologies CoRR abs/0710.4663: (2007) | |
| 37 | Saibal Mukhopadhyay, Swarup Bhunia, Kaushik Roy: Modeling and Analysis of Loading Effect in Leakage of Nano-Scaled Bulk-CMOS Logic Circuits CoRR abs/0710.4729: (2007) | |
| 36 | Saibal Mukhopadhyay, Keunwoo Kim, Jae-Joon Kim, Shih-Hsien Lo, Rajiv V. Joshi, Ching-Te Chuang, Kaushik Roy: Estimation of gate-to-channel tunneling current in ultra-thin oxide sub-50nm double gate devices. Microelectronics Journal 38(8-9): 931-941 (2007) | |
| 2006 | ||
| 35 | Animesh Datta, Swarup Bhunia, Jung Hwan Choi, Saibal Mukhopadhyay, Kaushik Roy: Speed binning aware design methodology to improve profit under parameter variations. ASP-DAC 2006: 712-717 | |
| 34 | Swaroop Ghosh, Saibal Mukhopadhyay, Kee-Jong Kim, Kaushik Roy: Self-calibration technique for reduction of hold failures in low-power nano-scaled SRAM. DAC 2006: 971-976 | |
| 33 | Qikai Chen, Saibal Mukhopadhyay, Aditya Bansal, Kaushik Roy: Circuit-aware device design methodology for nanometer technologies: a case study for low power SRAM design. DATE 2006: 983-988 | |
| 32 | Kaushik Roy, Hamid Mahmoodi-Meimand, Saibal Mukhopadhyay, Hari Ananthan, Aditya Bansal, Tamer Cakici: Double-Gate SOI Devices for Low-Power and High-Performance Applications. VLSI Design 2006: 445-452 | |
| 31 | Amit Agarwal, Saibal Mukhopadhyay, Arijit Raychowdhury, Kaushik Roy, Chris H. Kim: Leakage Power Analysis and Reduction for Nanoscale Circuits. IEEE Micro 26(2): 68-80 (2006) | |
| 30 | Saibal Mukhopadhyay, Hamid Mahmoodi-Meimand, Kaushik Roy: A novel high-performance and robust sense amplifier using independent gate control in sub-50-nm double-gate MOSFET. IEEE Trans. VLSI Syst. 14(2): 183-192 (2006) | |
| 29 | Saibal Mukhopadhyay, Keunwoo Kim, Ching-Te Chuang, Kaushik Roy: Modeling and Analysis of Leakage Currents in Double-Gate Technologies. IEEE Trans. on CAD of Integrated Circuits and Systems 25(10): 2052-2061 (2006) | |
| 28 | Animesh Datta, Swarup Bhunia, Saibal Mukhopadhyay, Kaushik Roy: Delay Modeling and Statistical Design of Pipelined Circuit Under Process Variation. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2427-2436 (2006) | |
| 27 | Saibal Mukhopadhyay, Swarup Bhunia, Kaushik Roy: Modeling and analysis of loading effect on leakage of nanoscaled bulk-CMOS logic circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 25(8): 1486-1495 (2006) | |
| 2005 | ||
| 26 | Animesh Datta, Swarup Bhunia, Saibal Mukhopadhyay, Kaushik Roy: A Statistical Approach to Area-Constrained Yield Enhancement for Pipelined Circuits under Parameter Variations. Asian Test Symposium 2005: 170-175 | |
| 25 | Saibal Mukhopadhyay, Arijit Raychowdhury, Hamid Mahmoodi-Meimand, Kaushik Roy: Leakage Current Based Stabilization Scheme for Robust Sense-Amplifier Design for Yield Enhancement in Nano-scale SRAM. Asian Test Symposium 2005: 176-181 | |
| 24 | Saibal Mukhopadhyay, Swarup Bhunia, Kaushik Roy: Modeling and Analysis of Loading Effect in Leakage of Nano-Scaled Bulk-CMOS Logic Circuits. DATE 2005: 224-229 | |
| 23 | Animesh Datta, Swarup Bhunia, Saibal Mukhopadhyay, Nilanjan Banerjee, Kaushik Roy: Statistical Modeling of Pipeline Delay and Design of Pipeline under Process Variation to Enhance Yield in sub-100nm Technologies. DATE 2005: 926-931 | |
| 22 | Kaushik Roy, Hamid Mahmoodi-Meimand, Saibal Mukhopadhyay, Hari Ananthan, Aditya Bansal, Tamer Cakici: Double-gate SOI devices for low-power and high-performance applications. ICCAD 2005: 217-224 | |
| 21 | Arijit Raychowdhury, Saibal Mukhopadhyay, Kaushik Roy: A Feasibility Study of Subthreshold SRAM Across Technology Generations. ICCD 2005: 417-424 | |
| 20 | Qikai Chen, Saibal Mukhopadhyay, Hamid Mahmoodi, Kaushik Roy: Process Variation Tolerant Online Current Monitor for Robust Systems. IOLTS 2005: 171-176 | |
| 19 | Animesh Datta, Saibal Mukhopadhyay, Swarup Bhunia, Kaushik Roy: Yield Prediction of High Performance Pipelined Circuit with Respect to Delay Failures in Sub-100nm Technology. IOLTS 2005: 275-280 | |
| 18 | Saibal Mukhopadhyay, Keunwoo Kim, Ching-Te Chuang, Kaushik Roy: Modeling and analysis of total leakage currents in nanoscale double gate devices and circuits. ISLPED 2005: 8-13 | |
| 17 | Saibal Mukhopadhyay, Keunwoo Kim, Jae-Joon Kim, Shih-Hsien Lo, Rajiv V. Joshi, Ching-Te Chuang, Kaushik Roy: Modeling and Analysis of Gate Leakage in Ultra-thin Oxide Sub-50nm Double Gate Devices and Circuits. ISQED 2005: 410-415 | |
| 16 | Saibal Mukhopadhyay, Hamid Mahmoodi-Meimand, Kaushik Roy: Design of High Performance Sense Amplifier Using Independent Gate Control in sub-50nm Double-Gate MOSFET. ISQED 2005: 490-495 | |
| 15 | Chris H. Kim, Jae-Joon Kim, Saibal Mukhopadhyay, Kaushik Roy: A forward body-biased low-leakage SRAM cache: device, circuit and architecture considerations. IEEE Trans. VLSI Syst. 13(3): 349-357 (2005) | |
| 14 | Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Ghosh, Saibal Mukhopadhyay, Kaushik Roy: Low-power scan design using first-level supply gating. IEEE Trans. VLSI Syst. 13(3): 384-395 (2005) | |
| 13 | Saibal Mukhopadhyay, Hamid Mahmoodi-Meimand, Kaushik Roy: Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS. IEEE Trans. on CAD of Integrated Circuits and Systems 24(12): 1859-1880 (2005) | |
| 12 | Saibal Mukhopadhyay, Arijit Raychowdhury, Kaushik Roy: Accurate estimation of total leakage in nanometer-scale bulk CMOS circuits based on device geometry and doping profile. IEEE Trans. on CAD of Integrated Circuits and Systems 24(3): 363-381 (2005) | |
| 2004 | ||
| 11 | Amit Agarwal, Chris H. Kim, Saibal Mukhopadhyay, Kaushik Roy: Leakage in nano-scale technologies: mechanisms, impact and design considerations. DAC 2004: 6-11 | |
| 10 | Saibal Mukhopadhyay, Hamid Mahmoodi-Meimand, Kaushik Roy: Statistical design and optimization of SRAM cell for yield enhancement. ICCAD 2004: 10-13 | |
| 9 | Swarup Bhunia, Hamid Mahmoodi-Meimand, Saibal Mukhopadhyay, Debjyoti Ghosh, Kaushik Roy: A Novel Low-Power Scan Design Technique Using Supply Gating. ICCD 2004: 60-65 | |
| 8 | Arijit Raychowdhury, Saibal Mukhopadhyay, Kaushik Roy: Modeling and Estimation of Leakage in Sub-90nm Devices. VLSI Design 2004: 65- | |
| 7 | Arijit Raychowdhury, Saibal Mukhopadhyay, Kaushik Roy: A circuit-compatible model of ballistic carbon nanotube field-effect transistors. IEEE Trans. on CAD of Integrated Circuits and Systems 23(10): 1411-1420 (2004) | |
| 2003 | ||
| 6 | Saibal Mukhopadhyay, Arijit Raychowdhury, Kaushik Roy: Accurate estimation of total leakage current in scaled CMOS logic circuits based on compact current modeling. DAC 2003: 169-174 | |
| 5 | Arijit Raychowdhury, Saibal Mukhopadhyay, Kaushik Roy: Modeling of Ballistic Carbon Nanotube Field Effect Transistors for Efficient Circuit Simulation. ICCAD 2003: 487-490 | |
| 4 | Saibal Mukhopadhyay, Kaushik Roy: Modeling and estimation of total leakage current in nano-scaled CMOS devices considering the effect of parameter variation. ISLPED 2003: 172-175 | |
| 3 | Chris H. Kim, Jae-Joon Kim, Saibal Mukhopadhyay, Kaushik Roy: A forward body-biased low-leakage SRAM cache: device and architecture considerations. ISLPED 2003: 6-9 | |
| 2 | Saibal Mukhopadhyay, Cassondra Neau, R. T. Cakici, Amit Agarwal, Chris H. Kim, Kaushik Roy: Gate leakage reduction for scaled devices using transistor stacking. IEEE Trans. VLSI Syst. 11(4): 716-730 (2003) | |
| 2002 | ||
| 1 | Kaushik Roy, Saibal Mukhopadhyay, Hamid Mahmoodi-Meimand: Leakage Current in Deep-Submicron CMOS Circuits. Journal of Circuits, Systems, and Computers 11(6): 575-600 (2002) | |