| 2008 | ||
|---|---|---|
| 3 | Yoshiki Higo, Kenji Murao, Shinji Kusumoto, Katsuro Inoue: Predicting fault-prone modules based on metrics transitions. DEFECTS 2008: 6-10 | |
| 2 | Hisashi Tanaka, Koichi Tanno, Hiroki Tamura, Kenji Murao: Design of CMOS OTAs for Low-Voltage and Low-Power Application. IEICE Transactions 91-A(11): 3385-3388 (2008) | |
| 2006 | ||
| 1 | Kenji Ohno, Hiroki Matsumoto, Kenji Murao: A Switched-Voltage High-Accuracy Sample/Hold Circuit. APCCAS 2006: 179-182 | |
| 1 | Yoshiki Higo | [3] |
| 2 | Katsuro Inoue | [3] |
| 3 | Shinji Kusumoto | [3] |
| 4 | Hiroki Matsumoto | [1] |
| 5 | Kenji Ohno | [1] |
| 6 | Hiroki Tamura | [2] |
| 7 | Hisashi Tanaka | [2] |
| 8 | Koichi Tanno | [2] |